IP Library Granted Patent US 7,554,083
Granted Patent B2
US 7,554,083 · App. 11/418,244 · Granted Jun 30, 2009

Integration of electromagnetic detector on integrated chip

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Quick Facts
Patent No.
US 7,554,083
App. No.
11/418,244
Granted
Jun 30, 2009
Kind
B2
Abstract

A device includes an integrated circuit (IC) and at least one ultra-small resonant structure and a detection mechanism are formed on said IC. At least the ultra-small resonant structure portion of the device is vacuum packaged. The ultra-small resonant structure includes a plasmon detector having a transmission line. The detector mechanism includes a generator mechanism constructed and adapted to generate a beam of charged particles along a path adjacent to the transmission line; and a detector microcircuit disposed along said path, at a location after said beam has gone past said line, wherein the generator mechanism and the detector microcircuit are disposed adjacent transmission line and wherein a beam of charged particles from the generator mechanism to the detector microcircuit electrically couples a plasmon wave traveling along the metal transmission line to the microcircuit. The detector mechanism may be electrically connected to the underlying IC.

Claims (46)

1. A method of making a device comprising:

obtaining an integrated circuit (IC);

forming one or more ultra-small resonant structures on an external surface of the IC, wherein the ultra-small resonant structures are constructed and adapted to respond to data encoded in an electromagnetic radiation (EMR) beam;

forming a detection mechanism on said IC; and

vacuum packaging at least said ultra-small resonant structure and said detection mechanism.

2. A method as in claim 1 wherein the one or more ultra-small resonant structures comprise a transmission line; and

wherein the detection mechanism comprises:

a generator mechanism constructed and adapted to generate a beam of charged particles along a path adjacent to the transmission line; and

a detector microcircuit disposed along said path, at a location after said beam has gone past said line,

wherein the generator mechanism and the detector microcircuit are disposed adjacent the transmission line and wherein a beam of charged particles from the generator mechanism to the detector microcircuit electrically couples a plasmon wave traveling along the metal transmission line to the detector microcircuit.

3. A method as in claim 1 wherein said step of vacuum packaging comprises:

hermetically sealing at least said ultra-small resonant structure and said detection mechanism.

4. A method as in any one of claims 1 - 3 wherein said one or more ultra-small resonant structures are constructed and adapted to detect electromagnetic radiation (EMR).

5. A method as in any one of claims 1 - 3 wherein said detection mechanism includes a source of charged particles.

6. A method as in claim 5 wherein said source of charged particles is selected from the group comprising:

an ion gun, a thermionic filament, tungsten filament, a cathode, a vacuum triode, a field emission cathode, a planar vacuum triode, an electron-impact ionizer, a laser ionizer, a chemical ionizer, a thermal ionizer, an ion-impact ionizer.

7. A method as in claim 5 wherein the charged particles are selected from the group comprising: positive ions, negative ions, electrons, and protons.

8. A method as in claim 1 further comprising:

electrically connecting said detection mechanism to said IC.

9. A device comprising:

an integrated circuit (IC);

at least one ultra-small resonant structure formed on an external surface of said IC; and

a detection mechanism, wherein the at least one ultra-small resonant structure and said detection mechanism are constructed and adapted to detect plasmons.

10. A device as in claim 9 wherein said at least one ultra-small resonant structure is vacuum packaged.

11. A device as in claim 9 wherein at least one of said detection mechanism is electrically connected to said IC.

12. A device as in claim 9 wherein said detection mechanism comprises a source of charged particles.

13. A device as in claim 12 wherein said source of charged particles is selected from the group comprising:

an ion gun, a thermionic filament, a cathode, vacuum triode, a planar vacuum triode, a field emission cathode, an electron-impact ionizer, a laser ionizer, a chemical ionizer, a thermal ionizer, an ion-impact ionizer.

14. A device as in claim 12 wherein the charged particles are selected from the group comprising: positive ions, negative ions, electrons, and protons.

15. A device as in claim 9 wherein the at least one ultra-small resonant structure comprises a transmission line;

and wherein the detection mechanism comprises:

a generator mechanism constructed and adapted to generate a beam of charged particles along a path adjacent to the transmission line; and

a detector microcircuit disposed along said path, at a location after said beam has gone past said line,

wherein the generator mechanism and the detector microcircuit are disposed adjacent transmission line and wherein a beam of charged particles from the generator mechanism to the detector microcircuit electrically couples the a plasmon wave traveling along the metal transmission line to the microcircuit.

16. A device comprising:

an integrated circuit (IC);

one or more structures formed on a surface of the IC and electrically connected to at least one electronic circuit in the IC, said structures including a plasmon detection device constructed and adapted to detect plasmons incident on the surface of the IC and to provide a signal indicative of the presence of said plasmons to said at least one electronic circuit.

17. A device as in claim 16 wherein said plasmon detection device comprises:

a transmission line;

a generator mechanism constructed and adapted to generate a beam of charged particles along a path adjacent to the transmission line; and

a detector microcircuit disposed along said path, at a location after said beam has gone past said line,

wherein the generator mechanism and the detector microcircuit are disposed adjacent transmission line and wherein a beam of charged particles from the generator mechanism to the detector microcircuit electrically couples the a plasmon wave traveling along the metal transmission line to the microcircuit.

18. A device as in claim 16 wherein at least some of said one or more of the transmission line, the generator mechanism and the detector microcircuit are vacuum packaged.

19. A method of communicating data to circuitry within an integrated circuit (IC), said data being encoded in an electromagnetic wave, the method comprising:

using a plasmon detector on a surface of said IC to detect the electromagnetic wave; and

providing a signal indicative of said wave to said circuitry.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE TO REMOVE PATENT 7,559,836 WHICH WAS ERRONEOUSLY CITED IN LINE 27 OF SCHEDULE I AND NEEDS TO BE REMOVED AS FILED ON 4/10/2012. PREVIOUSLY RECORDED ON REEL 028022 FRAME 0961. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded Apr 25, 2018
From: ADVANCED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 046011/0827 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNMENT PREVIOUSLY RECORDED AT REEL: 028022 FRAME: 0961. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECTIVE ASSIGNMENT TO CORRECT THE #27 IN SCHEDULE I OF ASSIGNMENT SHOULD BE: TRANSMISSION OF DATA BETWEEN MICROCHIPS USING A PARTICLE BEAM, PAT. NO 7569836.. Recorded Dec 21, 2017
From: ADVANCED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 044945/0570 →
NUNC PRO TUNC ASSIGNMENT Recorded Oct 9, 2012
From: APPLIED PLASMONICS, INC.
To: ADVANCED PLASMONICS, INC.
Reel/Frame 029095/0525 →
NUNC PRO TUNC ASSIGNMENT Recorded Oct 3, 2012
From: VIRGIN ISLAND MICROSYSTEMS, INC.
To: APPLIED PLASMONICS, INC.
Reel/Frame 029067/0657 →
SECURITY AGREEMENT Recorded Apr 10, 2012
From: ADVANCED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 028022/0961 →
SECURITY AGREEMENT Recorded Dec 4, 2009
From: APPLIED PLASMONICS, INC.
To: V.I. FOUNDERS, LLC
Reel/Frame 023594/0877 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 21, 2006
From: GORRELL, JONATHAN; DAVIDSON, MARK; TOKARZ, JEAN; GASPAROV, LEV
To: VIRGIN ISLANDS MICROSYSTEMS, INC.
Reel/Frame 017831/0548 →