System and method for rating reliability of storage devices
View Patent ↗A method for rating reliability of storage devices is disclosed. A reliability rating for a group of storage devices is assigned to a first rating. The first rating indicates an expected reliability that is the same for each individual one of the storage devices in the group. The expected reliability provides an indication of how reliable the storage devices in the group are expected to be. Information indicating one or more operational characteristics for one or more of the storage devices in the group may be periodically received and analyzed to determine whether the reliability rating for the group of storage devices should be changed. If so then the reliability rating for the group is changed to a different rating, e.g., to indicate either a decrease or an increase in the expected reliability of the storage devices in the group.
1. A computer-implemented method for rating reliability of storage devices, the method comprising:
assigning a reliability rating for a first group of storage devices to a first rating, wherein the first group of storage devices includes a first storage device and one or more other storage devices, wherein the first rating indicates an expected reliability that is the same for each individual one of the storage devices in the first group;
receiving first information indicating one or more operational characteristics for one or more of the storage devices in the first group; and
in response to said receiving, changing the reliability rating for the first group of storage devices to a second rating different from the first rating, wherein the second rating indicates an expected reliability that is the same for each individual one of the storage devices in the first group;
wherein said changing the reliability rating for the first group of storage devices to the second rating indicates that the expected reliability for all storage devices in the first group, including the first storage device, has changed, even though the one or more operational characteristics prompting the change to the reliability rating do not apply to the first storage device.
2. The computer implemented method of claim 1 , further comprising:
analyzing the first information to determine whether to change the reliability rating for the first group of storage devices;
wherein the reliability rating for the first group of storage devices is changed to the second rating in response to said analyzing.
3. The computer implemented method of claim 1 , wherein the first information indicating the one or more operational characteristics for the one or more storage devices in the first group comprises information indicating failure statistics for the one or more storage devices, wherein the reliability rating for the first group of storage devices is changed to the second rating based on the failure statistics.
4. The computer implemented method of claim 1 , wherein the second rating indicates that the expected reliability for each of the storage devices in the first group has decreased relative to the first rating.
5. The computer implemented method of claim 4 ,
wherein the first information indicates that the first storage device has not experienced any failures and indicates that the one or more other storage devices have experienced one or more failures;
wherein said changing the reliability rating for the first group of storage devices to the second rating indicates that the expected reliability for the first storage device has decreased, based on the one or more failures experienced by the one or more other storage devices in the first group.
6. The computer implemented method of claim 1 , wherein the second rating indicates that the expected reliability for each of the storage devices in the first group has increased relative to the first rating.
7. The computer implemented method of claim 1 , further comprising:
grouping the storage devices together into the first group, wherein said grouping the storage devices together into the first group is performed according to one or more characteristics indicating that the storage devices have similar expected reliabilities.
8. The computer implemented method of claim 7 , wherein the one or more characteristics indicating that the storage devices have similar expected reliabilities comprise information indicating that the storage devices are from a common manufacturing batch.
9. The computer implemented method as recited in claim 7 , wherein the one or more characteristics indicating that the storage devices have similar expected reliabilities comprise one or more operational characteristics of the storage devices.
10. The computer implemented method of claim 1 , further comprising:
monitoring one or more reliability characteristics of the storage devices in the first group; and
assigning a first subset of the storage devices to a second group instead of the first group in response to determining that storage devices in the first subset have deviated from other storage devices in the first group in at least one of the one or more reliability characteristics.
11. The computer implemented method of claim 10 , wherein said monitoring the one or more reliability characteristics of the storage devices in the first group comprises monitoring one or more of:
temperature information for the storage devices;
amount of operating time for the storage devices;
numbers of read operations performed by the storage devices; and/or
numbers of write operations performed by the storage devices.
12. The computer implemented method of claim 1 , wherein the reliability rating for the first group of storage devices is changed to the second rating in response to determining that the one or more operational characteristics for the one or more storage devices in the first group are different from expected operational characteristics.
13. The computer implemented method of claim 1 , wherein the reliability rating for the first group of storage devices is changed to the second rating in response to determining that a first operational characteristic for one or more storage devices in the first group differs by more than a threshold amount from a first value.
14. The computer implemented method of claim 1 , wherein the storage devices comprise one or more of:
disk drives;
tape drives; and/or
optical drives.
15. A data storage system comprising:
at least one processor; and
a first storage device and one or more other storage devices;
wherein the at least one processor is operable to execute program instructions in order to:
assign a reliability rating for a first group of the storage devices to a first rating, wherein the first group includes the first storage device and the one or more other storage devices, wherein the first rating indicates an expected reliability for each of the storage devices in the first group;
receive first information indicating one or more operational characteristics for one or more of the storage devices in the first group; and
change the reliability rating for the first group of storage devices to a second rating based on the first information, wherein changing the reliability rating for the first group indicates that the expected reliability for each of the storage devices in the first group has changed;
wherein the change to the reliability rating for the first group of storage devices to the second rating indicates that the expected reliability for all storage devices in the first group, including the first storage device, has changed, even though the one or more operational characteristics prompting the change to the reliability rating do not apply to the first storage device.
16. The data storage system of claim 15 , wherein the first information indicating the one or more operational characteristics for the one or more storage devices in the first group comprises information indicating failure statistics for the one or more storage devices, wherein the reliability rating for the first group of storage devices is changed to the second rating based on the failure statistics.
17. The data storage system of claim 15 , wherein the second rating indicates that the expected reliability for each of the storage devices in the first group has decreased relative to the first rating; and
in response to changing the reliability rating for the first group of storage devices to the second rating, the data storage system is further configured to:
increase the redundancy of data stored on the storage devices in the first group; or
move all or part of the data from the first group of storage devices to a second group of storage devices with a higher reliability rating.
18. The data storage system of claim 17 ,
wherein the first information indicates that the first storage device has not experienced any failures and indicates that the one or more other storage devices have experienced one or more failures;
wherein said changing the reliability rating for the first group of storage devices to the second rating indicates that the expected reliability for the first storage device has decreased, based on the one or more failures experienced by the one or more other storage devices in the first group.
19. The data storage system of claim 15 , wherein the second rating indicates that the expected reliability for each of the storage devices in the first group has increased relative to the first rating.
20. A computer-implemented method for rating reliability of computing devices, the method comprising:
assigning a reliability rating for a first group of computing devices to a first rating, wherein the first group of computing devices includes a first computing device and one or more other computing devices wherein the first rating indicates an expected reliability that is the same for each individual one of the computing devices in the first group;
receiving first information indicating one or more operational characteristics for one or more of the computing devices in the first group; and
in response to said receiving, changing the reliability rating for the first group of computing devices to a second rating different from the first rating, wherein the second rating indicates an expected reliability that is the same for each individual one of the computing devices in the first group;
wherein said changing the reliability rating for the first group of computing devices to the second rating indicates that the expected reliability for all computing devices in the first group, including the first computing device, has changed, even though the one or more operational characteristics prompting the change to the reliability rating do not apply to the first computing device.