Spectroscopy probe and material processing system
View Patent ↗A process monitoring system determines a spectral response of a process material. This system has a tunable laser for generating an optical signal that is wavelength tuned over a scan band and an optical probe for conveying the optical signal to the process material and detecting the spectral response of the process material. The optical probe expands a beam of the optical signal to a diameter of greater than 10 millimeters. This avoids one of the difficulties with monitoring these process applications by ensuring that the spectroscopy measurements are accurate and repeatable. It is desirable to sample a relatively large area of the processed material since it can be heterogeneous. Additionally the large area mitigates spectral noise such as from speckle.
1. A process monitoring system for determining a spectral response of a process material, the system comprising:
a drum for containing a process material, the process material being processed within the drum, the drum comprising a window element;
a semiconductor tunable source for generating an optical signal that is wavelength tuned over a scan band; and
an optical probe, secured on an outside of the drum, for conveying the optical signal to the process material, through the window element, and detecting the optical signal after diffuse reflection, received through the window element, from the process material to yield the spectral response of the process material, the optical probe for expanding a beam of the optical signal to a diameter of greater than 10 millimeters prior to the diffuse reflection from the process material,
wherein the optical probe comprises a projection lens system that expands the beam of the optical signal from the tunable source to the diameter of greater than 10 millimeters using a series of projections lenses that expand and improve a collimation of the beam of the optical signal.
2. A system as claimed in claim 1 , wherein the diameter of the beam of the optical signal is greater than 20 millimeters.
3. A system as claimed in claim 1 , wherein the diameter of the beam of the optical signal is greater than 30 millimeters.
4. A system as claimed in claim 1 , wherein the beam of the optical signal is collimated.
5. A system as claimed in claim 1 , wherein the beam of the optical signal has a divergence angle of less than 4 degrees.
6. A system as claimed in claim 1 , further comprising a host system for controlling a material processing system, including the drum, that is containing the process material in response to the detected spectral response of the process material.
7. A system as claimed in claim 1 , wherein the window element between the optical probe and the process material is made of nitrogen impregnated sapphire.
8. A system as claimed in claim 1 , wherein the optical probe further comprises:
a frame secured to the drum;
said projection lens system carried by the frame for receiving the optical signal from the semiconductor tunable source and expanding and collimating the beam of the optical signal;
a detector for detecting light from the process material; and
a collection lens system for collecting light from the process material and directing the light to the detector.
9. A system as claimed in claim 1 , further comprising a single mode fiber for receiving the optical signal from the tunable signal source and transmitting the optical signal to the series of projection lenses.
10. A system as claimed in claim 1 , wherein the optical probe further comprises:
a detector for detecting light from the process material; and
a collection lens system that is angled relative to the projection lens system for collecting the optical signal after diffuse reflection from the process material and directing the light to the detector.
11. A system as claimed in claim 1 , wherein the projection lens system converts a Gaussian intensity distribution of the beam to a more uniform intensity distribution.
12. A system as claimed in claim 1 , wherein the projection lens system comprises two lenses in which the beam goes through a focal spot between the two lenses.
13. A system as claimed in claim 1 , wherein the optical probe further comprises
a detector for detecting light from the process material; and
a collection lens system for collecting the optical signal after diffuse reflection from the process material and directing the light to the detector.
14. A process monitoring system for determining a spectral response of a process material, the system comprising:
a drum for containing a process material, the process material being processed within the drum;
a semiconductor tunable source for generating an optical signal that is wavelength tuned over a scan band; and
an optical probe, secured on an outside of the drum, for conveying the optical signal to the process material and detecting the optical signal after diffuse reflection from the process material to yield the spectral response of the process material, the optical probe for expanding a beam of the optical signal to a diameter of greater than 10 millimeters prior to the diffuse reflection from the process material, wherein the optical probe comprises:
a projection lens system that expands the beam of the optical signal from the tunable source to the diameter of greater than 10 millimeters using a series of projection lenses,
a detector for detecting light from the process material, and
a collection lens system that is angled relative to the projection lens system for collecting the optical signal after diffuse reflection from the process material and directing the light to the detector.
15. A system as claimed in claim 14 , wherein the projection lens system converts a Gaussian intensity distribution of the beam to a more uniform intensity distribution.
16. A system as claimed in claim 14 , wherein the projection lens system comprises two lenses in which the beam goes through a focal spot between the two lenses.