Method of adding a dither signal in output to the last integrator of a sigma-delta converter and relative sigma-delta converter
View Patent ↗A single-ended or differential single-stage, or multi-stage sigma-delta analog-to-digital converter includes at least one switched-capacitor integrator comprising a switched-capacitor network receiving as input a signal to be sampled, and an amplifier coupled in cascade to the switched-capacitor network. A circuit is coupled to the amplifier for feeding an analog dither signal to a virtual ground of the amplifier.
1. A sigma-delta analog-to-digital converter comprising:
at least one switched-capacitor integrator comprising
a switched-capacitor network receiving as an input a signal to be sampled, and
an amplifier coupled in cascade to said switched-capacitor network; and
a dither circuit coupled to said amplifier and comprising at least one digital-to-analog converter (OAC) receiving at least one externally generated digital dither signal for feeding at least one analog dither signal to said amplifier.
2. The sigma-delta analog-to-digital converter according to claim 1 , wherein said amplifier includes a virtual ground; and wherein the at least one analog dither signal is applied to the virtual ground of said amplifier.
3. The sigma-delta analog-to-digital converter according to claim 1 , wherein said switched-capacitor network comprises a double-sampled switched-capacitor structure.
4. The sigma-delta analog-to-digital converter according to claim 1 , wherein said switched-capacitor network comprises a single-sampled switched-capacitor structure so that the sigma-delta analog-to-digital converter is configured as a single-ended converter.
5. The sigma-delta analog-to-digital converter according to claim 1 , wherein said amplifier includes a pair of inputs; and wherein said dither circuit comprises two identical digital-to-analog converters (DAC) so that the sigma-delta analog-to-digital converter is configured as a differential converter, said two identical DACs receiving externally generated digital dither signals, and generating two identical analog dither signals and feeding them to the pair of inputs of said amplifier; and wherein said switched-capacitor network comprises a double-sampled switched-capacitor structure.
6. The sigma-delta analog-to-digital converter according to claim 5 , wherein said amplifier includes a pair of outputs; wherein said at least one switched-capacitor integrator comprises two identical feedback capacitors each connected between respective inputs and outputs of said amplifier; wherein the double-sampled switched-capacitor structure comprises four identical capacitors, a capacitance of which is half a capacitance of said feedback capacitors; and wherein each DAC comprises an array of binary weighted capacitors, a largest capacitance of said array of binary weighted capacitors being a fraction of the capacitance of said four identical capacitors.
7. The sigma-delta analog-to-digital converter according to claim 6 , wherein the largest capacitance of said array of binary weighted capacitors is four times smaller than a capacitance of said four identical capacitors.
8. The sigma-delta analog-to-digital converter according to claim 6 , further comprising:
an input integrator distinct from said at least one switched-capacitor integrator;
a double sampled bilinear switched capacitor network so that the sigma-delta analog-to-digital converter is configured as a second-order double-sampled analog-to-digital sigma-delta converter, said doubled sampled bilinear switched capacitor network including two pairs of differential inputs for receiving an analog differential input to be double-sampled; and
said input integrator generating a differential signal forming the input signal to said switched-capacitor network of said at least one switched-capacitor integrator, and further comprising at least one negative feedback digital-to-analog converter for feeding an analog replica of a digital output of the converter to dedicated pairs of inputs of said input integrator for double-sampling the analog replica.
9. A sigma-delta converter comprising:
at least one switched-capacitor integrator comprising
a switched-capacitor network receiving as an input a signal to be sampled, and
an amplifier coupled to said switched-capacitor network; and
at least one digital-to-analog converter (DAC) coupled to said amplifier and receiving at least one externally generated digital dither signal for feeding at least one analog dither signal to said amplifier.
10. The sigma-delta converter according to claim 9 , wherein said amplifier includes a virtual ground; and wherein the at least one analog dither signal is applied to the virtual ground of said amplifier.
11. The sigma-delta converter according to claim 9 , wherein the at least one dither signal is fed to a virtual ground of said amplifier is an analog dither signal; and wherein said switched-capacitor network comprises a double-sampled switched-capacitor structure.
12. The sigma-delta converter according to claim 9 , wherein said switched-capacitor network comprises a single-sampled switched-capacitor structure so that the sigma-delta converter is configured as a single-ended converter.
13. The sigma-delta converter according to claim 9 , wherein said amplifier includes a pair of inputs; and wherein said at least one DAC comprises two identical DACs so that the sigma-delta converter is configured as a differential converter, said two identical DACs receiving externally generated digital dither signals, and the at least one dither signal comprises two identical analog dither signals that are feed to the pair of inputs of said amplifier; and wherein said switched-capacitor network comprises a double-sampled switched-capacitor structure.
14. The sigma-delta converter according to claim 13 , wherein said amplifier includes a pair of outputs; wherein said at least one switched-capacitor integrator comprises two identical feedback capacitors each connected between respective inputs and outputs of said amplifier; wherein said double-sampled switched-capacitor structure comprises four identical capacitors, a capacitance of which is half a capacitance of said feedback capacitors; and wherein each DAC comprises an array of binary weighted capacitors, a largest capacitance of said array of binary weighted capacitors being a fraction of the capacitance of said four identical capacitors.
15. The sigma-delta converter according to claim 14 , wherein the largest capacitance of said array of binary weighted capacitors is four times smaller than a capacitance of said four identical capacitors.
16. The sigma-delta converter according to claim 14 , further comprising:
an input integrator distinct from said at least one switched-capacitor integrator;
a double sampled bilinear switched capacitor network so that the sigma-delta converter is configured as a second-order double-sampled sigma-delta converter, said doubled sampled bilinear switched capacitor network including two pairs of differential inputs for receiving an analog differential input to be double-sampled; and
said input integrator generating a differential signal forming the input signal to said switched-capacitor network of said at least one switched-capacitor integrator, and further comprising at least one negative feedback digital-to-analog converter for feeding an analog replica of a digital output of the converter to dedicated pairs of inputs of said input integrator for double-sampling the analog replica.
17. A method for operating a sigma-delta analog-to-digital converter comprising at least one switched-capacitor integrator having a switched-capacitor network and an amplifier coupled to the switched-capacitor network; and a dither circuit coupled to the amplifier, the method comprising:
sampling an input signal received by the switched-capacitor network; and
using the dither circuit comprising at least one digital-to-analog converter (DAC) for receiving at least one externally generated digital dither signal for feeding at least one analog dither signal to the amplifier.
18. The method according to claim 17 , wherein the amplifier includes a virtual ground; and wherein the at least one analog dither signal is applied to the virtual ground of the amplifier.
19. The method according to claim 17 , wherein the switched-capacitor network comprises a double-sampled switched-capacitor structure.
20. The method according to claim 17 , wherein the switched-capacitor network comprises a single-sampled switched-capacitor structure so that the sigma-delta analog-to-digital converter is configured as a single-ended converter.
21. The method according to claim 17 , wherein the amplifier includes a pair of inputs; and wherein the dither circuit comprises two identical digital-to-analog converters (DAC) so that the sigma-delta analog-to-digital converter is configured as a differential converter, the two identical DACs receiving externally generated digital dither signals, and generating the at least one analog dither signal to comprise two identical analog dither signals that are feed to the pair of inputs of the amplifier; and wherein the switched-capacitor network comprises a double-sampled switched-capacitor structure.
22. The method according to claim 21 , wherein the amplifier includes a pair of outputs; wherein the at least one switched-capacitor integrator comprises two identical feedback capacitors each connected between respective inputs and outputs of the amplifier; wherein the double-sampled switched-capacitor structure comprises four identical capacitors, a capacitance of which is half a capacitance of the feedback capacitors; and wherein each DAC comprises an array of binary weighted capacitors, a largest capacitance of the array of binary weighted capacitors being a fraction of the capacitance of the four identical capacitors.
23. The method according to claim 22 , wherein the largest capacitance of the array of binary weighted capacitors is four times smaller than a capacitance of the four identical capacitors.
24. The method according to claim 22 , wherein the sigma-delta analog-to-digital converter further comprises an input integrator distinct from the at least one switched-capacitor integrator; a double sampled bilinear switched capacitor network so that the sigma-delta analog-to-digital converter is configured as a second-order double-sampled analog-to-digital sigma-delta converter, the doubled sampled bilinear switched capacitor network including two pairs of differential inputs for receiving an analog differential input to be double-sampled, the method further comprising:
generating a differential signal by the input integrator for forming the input signal to the switched-capacitor network of the at least one switched-capacitor integrator; and
feeding an analog replica of a digital output of the converter to dedicated pairs of inputs of the input integrator for double-sampling the analog replica, the feeding based upon the sigma-delta analog-to-digital converter further comprising at least one negative feedback digital-to-analog converter.