Integrated scanning and ocular tomography system and method
View Patent ↗Systems and methods of the present invention measure at least one reflecting surface of an object disposed along an optical path. In some embodiments a measured optical interference signal for each of at least three wavelengths of reflected light may be used to determine a modulation of frequency components of a Fourier series. Frequency components of a Fourier series may be transformed to spatial components that describe intensities and positions of light reflected along an optical path. Systems and methods of the present invention permit rapid measuring and may monitor corneal thickness during surgery. The invention may do so by integrating an ablation device and a measurement apparatus into a single system. An integrated scanning and monitoring system may include an ablative light source producing an ablative beam and a measurement light source producing a measurement beam.
1. A method of treating a tissue, the method comprising:
directing an ablative beam for ablating the tissue via a scanning device to the tissue;
directing a measurement beam for measuring a profile of the tissue via the scanning device to the tissue, the measurement beam comprising at least three wavelengths, wherein a path of the ablative beam and a path of the measurement beam are substantially concentric as directed onto the tissue and wherein the measurement light beam comprising the at least three wavelengths is reflected from the tissue;
measuring a signal for each of the at least three wavelengths reflected from the tissue; and
combining the measured signals to determine a thickness profile of the tissue; and
ablating the tissue in response to the thickness profile.
2. The method of claim 1 wherein the path of the ablative beam and the path of the measurement beam are substantially coaxial as directed onto the tissue.
3. The method of claim 1 further comprising measuring of the tissue intermittently at time intervals between instances of ablation.
4. The method of claim 1 wherein the measurement beam is directed to the tissue via the scanning device for measuring a thickness of the tissue.
5. An apparatus for ablating tissue, the apparatus comprising:
an ablative light source producing an ablative light beam;
a measurement light source producing a measurement light beam comprising at least three wavelengths of light;
a detector configured to measure a signal for each of the at least three wavelengths of light;
a scanner receiving the ablative beam from the ablative light source and the measurement beam from the measurement light source, the scanner including optical elements for directing the ablative beam and the measurement beam to locations across the tissue so as to ablate the tissue with the ablative beam and measure a thickness profile of the tissue with the measurement beam, a path of the ablative beam and a path of the measurement beam being substantially concentric at the tissue; and
a processor comprising a tangible medium configured to combine the measured signals to determine the thickness profile of the tissue and ablate the tissue in response to the thickness profile.
6. The apparatus of claim 5 wherein the path of the ablative beam and the path of the measurement beam are substantially coaxial as directed onto the tissue.
7. The apparatus of claim 5 further comprising a processor electrically connected with the ablative light source and the measurement light source, the processor controlling of the ablative light beam and the measurement light beam.