IP Library Granted Patent US 7,470,971
Granted Patent B2
US 7,470,971 · App. 11/433,930 · Granted Dec 30, 2008

Anodically bonded ultra-high-vacuum cell

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,470,971
App. No.
11/433,930
Granted
Dec 30, 2008
Kind
B2
Abstract

The present invention discloses an anodically bonded vacuum cell structure with a glass substrate including a cavity, and a substrate deposited on the glass substrate, thereby enclosing the cavity to form a bonding interface. The bonding interface having silicon such that the substrate includes a layer of silicon or a secondary substrate with silicon layer bonded onto the secondary substrate.

Claims (19)

1. An anodically bonded vacuum cell structure/assembly comprising:

a glass substrate having a cavity, wherein said cavity comprising an alkali metal;

a substrate deposited on said glass substrate thereby enclosing the cavity to form a bonding interface, said bonding interface having silicon.

2. The structure of claim 1 wherein said substrate comprises a layer of silicon.

3. The structure of claim 2 wherein said silicon layer is coated with a material selected from a group consisting of silver, gold, platinum, copper, nickel, titanium, rhodium and combinations thereof.

4. The structure of claim 1 wherein said substrate comprises a silicon layer on top of a secondary substrate.

5. The structure of claim 4 wherein said silicon layer is placed to substantially cover a top surface of the secondary substrate.

6. The structure of claim 4 wherein said silicon layer is placed only at a portion of the secondary substrate with the bonding interface.

7. The structure of claim 4 wherein said silicon layer is a crystalline silicon bonded to the secondary substrate.

8. The structure of claim 4 wherein said silicon layer is an amorphous silicon or polycrystalline silicon deposited by a chemical vapor deposition process on top of the secondary substrate.

9. The structure of claim 4 wherein said secondary substrate comprises a cavity below the bonding interface.

10. The structure of claim 9 wherein said silicon layer having an aperture to provide a path to and from the cavity of the secondary substrate.

11. The structure of claim 4 wherein said secondary substrate comprises a glass.

12. The structure of claim 4 wherein said secondary substrate comprises of a material selected of a group consisting of aluminum nitride, silicon nitride, silicon carbide, III-IV compounds such as GaAs and combinations thereof.

13. The structure of claim 1 wherein said substrate is a silicon chip having a metal coating, said metal coating selected of a group consisting of silver, gold, platinum, copper, nickel, titanium, rhodium and combinations thereof.

14. The structure of claim 1 wherein said glass substrate comprises a wall having a thickness ranging between about 0.5 mm to about 20 mm.

15. The structure of claim 1 wherein said substrate having a thickness ranging between about 10 μm to about 50 mm.

16. The structure of claim 1 wherein said cavity having side dimensions ranging between about 2 mm to about 50 mm.

17. The structure of claim 1 wherein said substrate comprises an optical component.

Assignments (2)
MERGER Recorded Nov 30, 2011
From: SARNOFF CORPORATION
To: SRI INTERNATIONAL
Reel/Frame 027305/0646 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2006
From: MCBRIDE, STERLING EDUARDO
To: SARNOFF CORPORATION
Reel/Frame 018137/0959 →