Systems and methods for identifying a substance
View Patent ↗A method for iteratively identifying a substance is described. The method includes determining whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter.
1. A method for iteratively identifying a substance, said method comprising:
determining whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter; and
replacing the original diffraction profile with the updated diffraction profile upon determining that the function of the difference exceeds the parameter.
2. A method in accordance with claim 1 further comprising determining an atomic number of the substance from the updated diffraction profile.
3. A method in accordance with claim 1 further comprising determining a packing fraction of the substance from the updated diffraction profile.
4. A method in accordance with claim 1 further comprising:
determining an atomic number of the substance before said determining whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter; and
preventing an iteration of said method upon determining that the function of the difference does not exceed the parameter.
5. A method in accordance with claim 1 further comprising:
determining a packing fraction of the substance before said determining whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter; and
preventing an iteration of said method upon determining that the function of the difference does not exceed the parameter.
6. A method in accordance with claim 1 further comprising generating the original diffraction profile by transmitting x-rays through the substance.
7. A processor for iteratively identifying a substance, said processor configured to perform a method to:
determine whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter; and
replace the original diffraction profile with the updated diffraction profile upon determining that the function of the difference exceeds the parameter.
8. A processor in accordance with claim 7 further configured to determine an atomic number of the substance from the updated diffraction profile.
9. A processor in accordance with claim 7 further configured to determine a packing fraction of the substance from the updated diffraction profile.
10. A processor in accordance with claim 7 further configured to:
determine an atomic number of the substance before determining whether the function of the difference between the updated diffraction profile and the original diffraction profile of the substance exceeds the parameter; and
prevent an iteration of said method upon determining that the first difference does not exceed the parameter.
11. A processor in accordance with claim 7 further configured to:
determine a packing fraction of the substance before determining whether the function of the difference between the updated diffraction profile and the original diffraction profile of the substance exceeds the parameter; and
prevent an iteration of said method upon determining that the function of the difference does not exceed the parameter.
12. A processor in accordance with claim 7 wherein the original diffraction profile is generated by transmitting x-rays through the substance.
13. A system for iteratively identifying a substance, said system comprising:
an x-ray source configured to generate x-rays;
a detector configured to receive primary radiation and scattered radiation after the x-rays pass through the substance; and
a processor configured to perform a method to determine whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter and replace the original diffraction profile with the updated diffraction profile upon determining that the function of the difference exceeds the parameter.
14. A system in accordance with claim 13 wherein said processor further configured to determine an atomic number of the substance from the updated diffraction profile.
15. A system in accordance with claim 13 wherein said processor further configured to determine a packing fraction of the substance from the updated diffraction profile.
16. A system in accordance with claim 13 wherein said processor further configured to:
determine an atomic number of the substance before determining whether the function of the difference between the updated diffraction profile and the original diffraction profile of the substance exceeds the parameter; and
prevent an iteration of said method upon determining that the function of the difference does not exceed the parameter.
17. A system in accordance with claim 13 wherein said processor further configured to:
determine a packing fraction of the substance before determining whether the function of the difference between the updated diffraction profile and the original diffraction profile of the substance exceeds the parameter; and
prevent an iteration of said method upon determining that the function of the difference does not exceed the parameter.