Semiconductor device and electronics device
A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal of a corresponding circuit block and a power supply line. A setting circuit is disposed to set each of the plurality of switch circuits to be in a valid or invalid state. A switch control circuit turns on each of the plurality of switch circuits according to a first control signal for indicating an operation state of the plurality of circuit blocks when each of the plurality of switch circuits is set in a valid state by the setting circuit and turns on each of the plurality of switch circuits regardless of the first control signal when each of the plurality of switch circuits is set in an invalid state by the setting circuit.
1. A semiconductor device comprising:
a plurality of circuit blocks;
a plurality of switch circuits disposed so as to correspond to said plurality of circuit blocks, respectively, and connected between a power supply terminal of a corresponding circuit block and a power supply line;
a setting circuit which sets each of said plurality of switch circuits to be in a valid or invalid state; and
a switch control circuit that turns on each of said plurality of switch circuits in accordance with a first control signal when it is set in the valid state by said setting circuit, and turns on each of said plurality of switch circuits regardless of the first control signal when it is set in the invalid state by said setting circuit, the first control signal being for indicating an operation state of said plurality of circuit blocks.
2. The semiconductor device according to claim 1 , wherein:
said setting circuit includes a test mode circuit that inactivates in a normal mode a plurality of test mode signals corresponding to said plurality of switch circuits respectively, and activates in a test mode one of the plurality of test mode signals designated by test mode information; and
said switch control circuit turns on each of said plurality of switch circuits in accordance with the first control signal when a corresponding test mode signal is inactivated, and turns on each of said plurality of switch circuits regardless of the first control signal when the corresponding test mode signal is activated.
3. The semiconductor device according to claim 1 , wherein:
said setting circuit includes a plurality of storage circuits which are disposed so as to correspond to said plurality of switch circuits respectively, store validity or invalidity of a corresponding switch circuit, and activates a storage state signal when storing the invalidity; and
said switch control circuit turns on each of said plurality of switch circuits in accordance with the first control signal when a corresponding storage state signal is inactivated, and turns on each of said plurality of switch circuits regardless of the first control signal when the corresponding storage state signal is activated.
4. The semiconductor device according to claim 3 , wherein
each of said plurality of storage circuits includes a fuse circuit programming validity or invalidity of the corresponding switch circuit.
5. The semiconductor device according to claim 1 , wherein said setting circuit includes:
a test mode circuit which inactivates in a normal mode a plurality of test mode signals corresponding to said plurality of switch circuits respectively and activates in a test mode one of the plurality of test mode signals designated by test mode information;
a plurality of storage circuits disposed so as to correspond to said plurality of switch circuits respectively, storing validity or invalidity of a corresponding switch circuit, and activating a storage state signal when storing the invalidity; and
a uniting circuit that activates each of a plurality of second control signals corresponding to said plurality of switch circuits respectively when one of a corresponding test mode signal and a corresponding storage state signal is activated, wherein
said switch control circuit turns on each of said plurality of switch circuits in accordance with the first control signal when a corresponding second control signal is inactivated, and turns on each of said plurality of switch circuits regardless of the first control signal when the corresponding second control signal is activated.
6. The semiconductor device according to claim 5 , wherein
each of said plurality of storage circuits includes a fuse circuit programming validity or invalidity of the corresponding switch circuit.
7. An electronics device comprising
a semiconductor device having:
a plurality of circuit blocks;
a plurality of switch circuits disposed so as to correspond to said plurality of circuit blocks, respectively, and connected between a power supply terminal of a corresponding circuit block and a power supply line;
a setting circuit which sets each of said plurality of switch circuits to be in a valid or invalid state; and
a switch control circuit that turns on each of said plurality of switch circuits in accordance with a first control signal when it is set in the valid state by said setting circuit, and turns on each of said plurality of switch circuits regardless of the first control signal when it is set in the invalid state by said setting circuit, the first control signal being for indicating an operation state of said plurality of circuit blocks.
8. The electronics device according to claim 7 , wherein:
said setting circuit includes a test mode circuit that inactivates in a normal mode a plurality of test mode signals corresponding to said plurality of switch circuits respectively, and activates in a test mode one of the plurality of test mode signals designated by test mode information; and
said switch control circuit turns on each of said plurality of switch circuits in accordance with the first control signal when a corresponding test mode signal is inactivated, and turns on each of said plurality of switch circuits regardless of the first control signal when the corresponding test mode signal is activated.
9. The electronics device according to claim 7 , wherein:
said setting circuit includes a plurality of storage circuits which are disposed so as to correspond to said plurality of switch circuits respectively, store validity or invalidity of a corresponding switch circuit, and activates a storage state signal when storing the invalidity; and
said switch control circuit turns on each of said plurality of switch circuits in accordance with the first control signal when a corresponding storage state signal is inactivated, and turns on each of said plurality of switch circuits regardless of the first control signal when the corresponding storage state signal is activated.
10. The electronics device according to claim 9 , wherein
each of said plurality of storage circuits includes a fuse circuit programming validity or invalidity of the corresponding switch circuit.
11. The electronics device according to claim 7 , wherein said setting circuit includes:
a test mode circuit which inactivates in a normal mode a plurality of test mode signals corresponding to said plurality of switch circuits respectively and activates in a test mode one of the plurality of test mode signals designated by test mode information;
a plurality of storage circuits disposed so as to correspond to said plurality of switch circuits respectively, storing validity or invalidity of a corresponding switch circuit, and activating a storage state signal when storing the invalidity; and
a uniting circuit that activates each of a plurality of second control signals corresponding to said plurality of switch circuits respectively when one of a corresponding test mode signal and a corresponding storage state signal is activated, wherein
said switch control circuit turns on each of said plurality of switch circuits in accordance with the first control signal when a corresponding second control signal is inactivated, and turns on each of said plurality of switch circuits regardless of the first control signal when the corresponding second control signal is activated.
12. The electronics device according to claim 11 , wherein
each of said plurality of storage circuits includes a fuse circuit programming validity or invalidity of the corresponding switch circuit.