Tuning a test trace configured for capacitive coupling to signal traces

1. A method for determining a configuration of a device comprising a plurality of signal traces and one or more test traces configured to capacitively couple to said plurality of signal traces, the method comprising:

selecting a test frequency of a test signal to be driven on selected ones of said plurality of signal traces during a test mode of operation of said device; and

tuning one or more circuit characteristics of a given one of said one or more test traces to generate a bandpass frequency response of said given test trace including a passband and a stopband, wherein a detection frequency corresponding either to said test frequency or a selected harmonic of said test frequency is included in said passband;

wherein said tuning one or more circuit characteristics of said given test trace comprises selecting a degree of capacitive coupling between said given test trace and each of multiple ones of said plurality of signal traces such that, within a specified constraint for signal degradation on said multiple ones of said signal traces, said bandpass frequency response of said given test trace satisfies a specified transmission requirement at said detection frequency.

2. The method as recited in claim 1 , wherein an anticipated noise frequency is included in said stopband.

3. The method as recited in claim 1 , wherein said selecting a degree of capacitive coupling between said given test trace and each of said multiple ones of said signal traces comprises selecting an amount of coupling area in which said given test trace and each of said multiple signal traces overlap.

4. The method as recited in claim 1 , wherein said selecting a degree of capacitive coupling between said given test trace and each of said multiple ones of said signal traces comprises selecting an amount of distance between said given test trace and each of said multiple signal traces.

5. The method as recited in claim 4 , wherein said device comprises a plurality of printed circuit board layers each configured for routing of traces, and wherein said selecting an amount of distance between said given test trace and each of said multiple signal traces comprises selecting a particular one of said plurality of printed circuit board layers for routing of said given test trace relative to another one of said plurality of printed circuit board layers configured for routing said multiple signal traces.

6. The method as recited in claim 1 , wherein said selecting a degree of capacitive coupling between said given test trace and each of said multiple ones of said signal traces comprises selecting a dielectric material for separating said given test trace and each of said multiple signal traces dependent upon a dielectric constant of said dielectric material.

7. The method as recited in claim 1 , wherein said given test trace is terminated by a terminator having a particular impedance, and wherein said tuning one or more circuit characteristics of said given test trace comprises selecting said particular impedance.

8. The method as recited in claim 1 , wherein said tuning one or more circuit characteristics of said given test trace comprises introducing impedance discontinuities along a path of said given test trace.

9. The method as recited in claim 1 , wherein each of said given test trace and said multiple ones of said signal traces includes a respective differentially-signaled pair of conductors.

10. The method as recited in claim 9 , wherein said selecting a degree of capacitive coupling between said given test trace and each of multiple ones of said plurality of signal traces comprises selecting first and second coupling areas for respective coupling between same-sense and opposite-sense conductors of said given test trace and said multiple ones of said signal traces, wherein said first coupling area is larger than said second coupling area.

11. The method as recited in claim 1 , wherein said specified transmission requirement specifies a minimum level of attenuation of a particular noise frequency relative to said detection frequency.

12. The method as recited in claim 1 , wherein said a specified constraint for signal degradation on said multiple ones of said signal traces specifies a maximum level of timing jitter on said multiple ones of said signal traces that is attributable to said degree of capacitive coupling.

13. The method as recited in claim 1 , wherein said device corresponds to a fully buffered dual inline memory module (FBDIMM) comprising a plurality of edge contacts respectively corresponding to said plurality of signal traces.

14. The method as recited in claim 13 , wherein said FBDIMM comprises an advanced memory buffer (AMB) configured to generate said test signal according to a constrained set of frequencies, and wherein said selecting said test frequency of said test signal is performed dependent upon said constrained set of frequencies.

15. A method for determining a configuration of a device comprising a plurality of signal traces and one or more test traces configured to capacitively couple to said plurality of signal traces, the method comprising:

selecting a test frequency of a test signal to be driven on selected ones of said plurality of signal traces during a test mode of operation of said device; and

tuning one or more circuit characteristics of a given one of said one or more test traces to generate a bandpass frequency response of said given test trace including a passband and a stopband, wherein a detection frequency corresponding either to said test frequency or a selected harmonic of said test frequency is included in said passband and wherein an anticipated noise frequency is included in said stopband.

16. The method as recited in claim 15 , wherein said device corresponds to a fully buffered dual inline memory module (FBDIMM) comprising a plurality of edge contacts respectively corresponding to said plurality of signal traces.

17. The method as recited in claim 16 , wherein said FBDIMM comprises an advanced memory buffer (AMB) configured to generate said test signal according to a constrained set of frequencies, and wherein said selecting said test frequency of said test signal is performed dependent upon said constrained set of frequencies.

18. The method as recited in claim 15 , wherein said tuning one or more circuit characteristics of said given test trace comprises selecting an amount of coupling area in which said given test trace and each of multiple ones of said signal traces overlap.

19. The method as recited in claim 15 , wherein said tuning one or more circuit characteristics of said given test trace comprises selecting an amount of distance between said given test trace and each of multiple ones of said signal traces.

20. A device, comprising:

a plurality of signal traces; and

one or more test traces configured to capacitively couple to said plurality of signal traces;

wherein a given one of the one or more test traces is physically arranged with respect to each of multiple ones of said plurality of signal traces to produce a bandpass frequency response of said given test trace including a passband and a stopband;

wherein a detection frequency corresponding either to a test frequency driven on selected ones of said plurality of signal traces during a test mode of operation of said device, or to a selected harmonic of said test frequency, is included in said passband; and

wherein said given test trace is further physically arranged to produce a degree of capacitive coupling with respect to each of said multiple ones of said plurality of signal traces such that said bandpass frequency response of said given test trace satisfies a specified transmission requirement at said detection frequency, while said degree of capacitive coupling also satisfies a specified constraint for signal degradation on said multiple ones of said signal traces.