IP Library Granted Patent US 8,253,214
Granted Patent B2
US 8,253,214 · App. 11/440,894 · Granted Aug 28, 2012

CMOS shared amplifier pixels with output signal wire below floating diffusion interconnect for reduced floating diffusion capacitance

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Quick Facts
Patent No.
US 8,253,214
App. No.
11/440,894
Granted
Aug 28, 2012
Kind
B2
Abstract

An image sensor includes a unit cell having a plurality of pixels; the unit cell comprising an amplifier input transistor that is shared by the plurality of pixels; a plurality of floating diffusions that are joined by a floating diffusion interconnect layer and are connected to the amplifier input transistor; and an interconnect layer which forms an output signal wire which shields the floating diffusion interconnect layer.

Claims (39)

1. An image sensor comprising:

a unit cell having a plurality of pixels; the unit cell comprising:

(a) an amplifier input transistor that is shared by the plurality of pixels;

(b) a plurality of floating diffusions that are joined by a floating diffusion interconnect layer and are connected to the amplifier input transistor; and

(c) a row select transistor electrically connected to an output signal wire,

wherein the floating diffusion interconnect layer is positioned directly over a portion of the output signal wire to shield the floating diffusion interconnect layer.

2. An image sensor comprising:

a unit cell having a plurality of pixels, each pixel comprising a photodetector comprising an n-type implant and a transfer gate; the unit cell comprising:

(a) an nMOS transistor comprising an n-type source drain implant disposed in a P well;

(b) a plurality of floating diffusions that are joined by a floating diffusion interconnect layer;

wherein the plurality of floating diffusions each have an n-type source drain implant and a deeper n-type implant that is more lightly doped than the floating diffusion n-type source drain implant with the deeper n-type implant enclosing the floating diffusion n-type source drain implant, wherein the floating diffusion n-type source drain implants and the deeper n-type implants are not disposed in the P well and the photodetector n-type implants and the deeper n-type implants are formed by the same implant; and

(c) a row select transistor electrically connected to an output signal wire,

wherein the floating diffusion interconnect layer is positioned directly a portion of the output signal wire to shield the floating diffusion interconnect layer.

3. An image sensor comprising:

a unit cell having a plurality of pixels, each pixel comprising a photodetector comprising an n-type implant and a transfer gate; the unit cell comprising:

(a) a plurality of floating diffusions having n-type source drain implants, and the floating diffusions are joined by a floating diffusion interconnect layer; wherein a deeper n-type implant that is more lightly doped than the n-type source drain implant encloses at least one of the n-type source drain implants for reducing junction capacitance, and wherein the photodetector n-type implants and the deeper n-type implants are formed by the same implant; and

(b) a row select transistor electrically connected to an output signal wire,

wherein the floating diffusion interconnect layer is positioned directly over a portion of the output signal wire to shield the floating diffusion interconnect layer.

4. A camera comprising:

an image sensor comprising:

a unit cell having a plurality of pixels; the unit cell comprising:

(a) an amplifier input transistor that is shared by the plurality of pixels;

(b) a plurality of floating diffusions that are joined by a floating diffusion interconnect layer and are connected to the amplifier input transistor; and

(c) a row select transistor electrically connected to an output signal wire,

wherein the floating diffusion interconnect layer is positioned directly over a portion of the output signal wire to shield the floating diffusion interconnect layer.

5. A camera comprising:

an image sensor comprising:

a unit cell having a plurality of pixels, each pixel comprising a photodetector comprising an n-type implant and a transfer gate; the unit cell comprising:

(a) an nMOS transistor comprising an n-type source drain implant disposed in a P well;

(b) a plurality of floating diffusions that are joined by a floating diffusion interconnect layer;

wherein the plurality of floating diffusions each have an n-type source drain implant and a deeper n-type implant that is more lightly doped than the floating diffusion n-type source drain implant with the deeper n-type implant enclosing the floating diffusion n-type source drain implant, wherein the floating diffusion n-type source drain implants and the deeper n-type implants are not disposed in the P well and the photodetector n-type implants and the deeper n-type implants are formed by the same implant; and

c) a row select transistor electrically connected to an output signal wire,

wherein the floating diffusion interconnect layer is positioned directly a portion of the output signal wire to shield the floating diffusion interconnect layer.

6. A camera comprising:

an image sensor comprising:

a unit cell having a plurality of pixels, each pixel comprising a photodetector comprising an n-type implant and a transfer gate; the unit cell comprising:

(a) a plurality of floating diffusions having n-type source drain implants, and the floating diffusions are joined by a floating diffusion interconnect layer; wherein a deeper n-type implant that is more lightly doped than the n-type source drain implant encloses at least one of the n-type source drain implants for reducing junction capacitance, and wherein the photodetector n-type implants and the deeper n-type implants are formed by the same implant; and

(b) a row select transistor electrically connected to an output signal wire,

wherein the floating diffusion interconnect layer is positioned directly over a portion of the output signal wire to shield the floating diffusion interconnect layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2011
From: EASTMAN KODAK COMPANY
To: OMNIVISION TECHNOLOGIES, INC.
Reel/Frame 026227/0213 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2006
From: GUIDASH, ROBERT M.; MRUTHYUNJAYA, RAVI; XU, WEIZE
To: EASTMAN KODAK COMPANY
Reel/Frame 018122/0553 →