Method for high topography patterning
View Patent ↗One inventive aspect is related to a method for isolating structures of a semiconductor material, comprising providing a pattern of the semiconductor material comprising at least one elevated line, defining device regions in the pattern, the device regions each comprising at least said at least one elevated line, and modifying the conductive properties of the semiconductor material outside said device regions, such that the device regions are electrically isolated.
1. A method of isolating structures of a semiconductor material, the method comprising:
providing a pattern of the semiconductor material comprising an elevated line;
defining two device regions in the pattern, the device regions being separated by an isolation region in the pattern located between the device regions wherein each device region comprises a region in which a FinFET is to be formed, wherein the isolation region electrically connects the device regions to each other, wherein the elevated line has a portion in each of the device regions and the isolation region; and
after providing a pattern of the semiconductor material and defining device regions in the pattern, converting all the semiconductor material of the isolation region connecting the device regions into dielectric material, such that the device regions are electrically isolated from each other.
2. The method according to claim 1 , wherein the defining of device regions comprises covering the device regions with a hard mask.
3. The method according to claim 2 , wherein the hard mask comprises a non-oxidizing material.
4. The method according to claim 3 , wherein the hard mask comprises materials formed of nitride.
5. The method according to claim 1 , wherein the converting of the semiconductor material comprises turning the semiconductor material outside the device regions into a dielectric material.
6. The method according to claim 5 , wherein the converting of the semiconductor material comprises a selective oxidation step.
7. The method according to claim 1 , wherein the modifying of the conductive properties comprises forming a PN junction between the device regions and the semiconductor material outside the device regions.
8. The method according to claim 1 , wherein the pattern comprises a dense high topography pattern obtained by lithographic patterning comprising interferometry.
9. The method according to claim 1 , wherein the pattern comprises a dense high topography pattern comprising a plurality of parallel lines.
10. The method according to claim 1 , wherein the semiconductor material comprises a SoI, GoI or SiGe layer.
11. The method according to claim 1 , wherein the elevated line comprises a semiconductor nanocarbon tube or a nanowire.
12. The method according to claim 1 , wherein the converting of the semiconductor material comprises modifying the portion of the elevated line in the isolation region.