IP Library Granted Patent US 7,476,979
Granted Patent B2
US 7,476,979 · App. 11/446,878 · Granted Jan 13, 2009

Chip scale surface mounted device and process of manufacture

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,476,979
App. No.
11/446,878
Granted
Jan 13, 2009
Kind
B2
Abstract

A chip scale package has a semiconductor MOSFET die which has a top electrode surface covered with a layer of a photosensitive liquid epoxy which is photolithographically patterned to expose portions of the electrode surface and to act as a passivation layer and as a solder mask. A solderable contact layer is then formed over the passivation layer. The individual die are mounted drain side down in a metal clip or can with the drain electrode disposed coplanar with a flange extending from the can bottom.

Claims (24)

1. A semiconductor device package comprising:

a power semiconductor device, said power semiconductor device including a first power electrode on one major surface thereof, and a second power electrode on a second opposing major surface thereof;

a passivation layer over said second power electrode of said power semiconductor device;

at least one solderable body over said second power electrode of said power semiconductor device; and

a conductive clip, said conductive clip having a web portion electrically and mechanically connected to said first power electrode of said power semiconductor device and at least one connection surface that faces a same direction as said at least one solderable body.

2. The semiconductor device package of claim 1 , wherein said passivation layer is comprised of an epoxy.

3. The semiconductor device package of claim 1 , wherein said passivation layer acts as a solder resist.

4. The semiconductor device package of claim 1 , wherein said passivation layer acts as a plating resist.

5. The semiconductor device package of claim 1 , further comprising a control electrode on said second opposing major surface, and another solderable body over said control electrode.

6. The semiconductor device package of claim 1 , further comprising a plurality of connection surfaces laterally spaced from said at least one connection surface.

7. The semiconductor device package of claim 1 , further comprising another connection surface disposed opposite said at least one connection surface.

8. The semiconductor device package of claim 1 , wherein said clip is cup-shaped, and said at least one connection surface is disposed on one side thereof.

9. The semiconductor device package of claim 8 , further comprising another connection surface disposed on a side opposite said at least one side.

10. The semiconductor device package of claim 1 , wherein said clip is comprised of copper.

11. The semiconductor device package of claim 1 , wherein said clip is silver-plated.

12. The semiconductor device package of claim 1 , wherein said clip does not include a connection surface on at least one side thereof.

13. The semiconductor device package of claim 1 , wherein said power semiconductor device is a power MOSFET.

14. The semiconductor device package of claim 1 , wherein said power semiconductor device is an IGBT.

15. The semiconductor device package of claim 1 , wherein said power semiconductor device is a diode.

16. The semiconductor device package of claim 1 , wherein said power semiconductor device is a thyristor.

17. The semiconductor device package of claim 1 , further comprising a low stress, high adhesion epoxy disposed around said power semiconductor device.

18. The semiconductor device package of claim 1 , wherein said first power electrode is electrically and mechanically connected to said web portion by a conductive adhesive.

19. The semiconductor device package of claim 1 , wherein said conductive clip is U-shaped.

20. The semiconductor device package of claim 1 , further comprising a mold compound disposed thereon.

Assignments (1)
CHANGE OF NAME Recorded Jul 23, 2018
From: INTERNATIONAL RECTIFIER CORPORATION
To: INFINEON TECHNOLOGIES AMERICAS CORP.
Reel/Frame 046612/0968 →