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App. No. 11/453,632 · Confirmation No. 6202

Parallel programming of flash memory during in-circuit test

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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2009-03-31 ABN Abandonment 2 View
2008-09-05 CTNF Non-Final Rejection 6 View
2008-09-05 892 List of references cited by examiner 1 View
2008-09-05 BIB Bibliographic Data Sheet 1 View
2008-09-05 FWCLM Index of Claims 1 View
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2008-09-05 SRNT Examiner's search strategy and results 2 View
2008-09-05 1449 List of References cited by applicant and considered by examiner 2 View
2007-11-08 NTC.PUB Notice of Publication 1 View
2006-08-28 PEFR Applicant Response to Pre-Exam Formalities Notice 5 View
2006-08-28 OATH Oath or Declaration filed 2 View
2006-07-27 IDS Information Disclosure Statement (IDS) Form (SB08) 5 View
2006-07-14 PEFN Pre-Exam Formalities Notice 2 View
2006-06-15 TRNA Transmittal of New Application 2 View
2006-06-15 SPEC Specification 17 View
2006-06-15 CLM Claims 5 View
2006-06-15 ABST Abstract 1 View
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2006-06-15 WFEE Fee Worksheet (SB06) 1 View
2006-06-15 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
11/453,632
Filed
2006-06-15
Pub. No.
US20070258298A1
Examiner
TON, DAVID
Art Unit
2117