Housing Duct
A housing duct comprises a housing and a conductor element. The housing has a sealing region. The conductor element is embedded in at least the sealing region of the housing. The conductor element has an electroplated fissured surface structure in at least the sealing region.
1 . A housing duct, comprising:
a housing having a sealing region; and
a conductor element embedded in at least the sealing region of the housing, the conductor element having an electroplated fissured surface structure in at least the sealing region.
2 . The housing duct of claim 1 , wherein the surface structure has a peak-to-valley height in the sealing region in the range of 5 to 40 μm.
3 . The housing duct of claim 2 , wherein the peak-to-valley height in the sealing region is in the range of 10 to 30 μm.
4 . The housing duct of claim 3 , wherein the peak-to-valley height in the sealing region is in the range of 10 to 20 μm.
5 . The housing duct of claim 1 , wherein the conductor element is electroplated with a coating material containing tin, zinc, copper, gold, silver, nickel or chromium.
6 . The housing duct of claim 1 , wherein the conductor element has a free end projecting from a bottom surface of the housing and a laid open end inside the housing.
7 . The housing duct of claim 6 , wherein the sealing region is between the free end and the laid open end.
8 . The housing duct of claim 1 , wherein the surface structure has a constant peak-to-valley height over the entire sealing region.
9 . The housing duct of claim 1 , wherein the housing and the conductor element have different coefficients of expansion.
10 . A method for producing a housing duct, comprising the steps of:
electroplating a conductor element to have a fissured surface structure; and
embedding at least the surface structure of the conductor element in at least a sealing region of a housing.
11 . The method of claim 10 , wherein the surface structure has a peak-to-valley height in the sealing region in the range of 5 to 40 μm.
12 . The method of claim 1 1 , wherein the peak-to-valley height in the sealing region is in the range of 10 to 30 μm.
13 . The method of claim 12 , wherein the peak-to-valley height in the sealing region is in the range of 10 to 20 μm.
14 . The method of claim 10 , wherein the conductor element is electroplated with a coating material containing tin, zinc, copper, gold, silver, nickel or chromium.
15 . The method of claim 10 , wherein the conductor element has a free end projecting from a bottom surface of the housing and a laid open end inside the housing, the sealing region being positioned between the free end and the laid open end.
16 . The method of claim 10 , wherein the surface structure has a constant peak-to-valley height over the entire sealing region.
17 . The method of claim 10 , wherein the housing and the conductor element have different coefficients of expansion.
18 . The method of claim 10 , further comprising the step of immersing the conductor element in an electroplating bath.
19 . The method of claim 18 , further comprising the step of reducing a concentration of a coating material in the electroplating bath while increasing current density.
20 . The method of claim 18 , further comprising the step of reducing circulation in the electroplating bath while increasing current density.
21 . The method of claim 18 , further comprising the step of adding stabilizers to the electroplating bath.