Resonance method for determining the spring constant of scanning probe microscope cantilevers using MEMS actuators
View Patent ↗In accordance with the invention, the spring constant of a scanning probe microscope cantilever mechanically coupled to a microelectromechanical system (MEMS) actuator may be determined in-situ using a frequency resonance method.
1. A method for determining a spring constant of a scanning probe microscope cantilever mechanically coupled to a MEMS actuator comprising:
determining a second resonance frequency of said MEMS actuator while a scanning probe tip mechanically coupled to said scanning probe microscope cantilever is in contact with a surface;
determining a first resonance frequency of said MEMS actuator while said scanning probe tip mechanically coupled to said scanning probe microscope cantilever is not in contact with said surface; and
calculating said spring constant using said first and said second resonance frequency.
2. The method of claim 1 wherein said MEMS actuator comprises an electromagnetic drive.
3. The method of claim 1 wherein said MEMS actuator comprises an electrostatic drive.
4. The method of claim 1 wherein said scanning probe tip is brought into contact with said surface.
5. The method of claim 1 wherein said surface is lowered such that said scanning probe microscope probe tip is not in contact with said surface.
6. The method of claim 4 further comprising keeping said scanning probe microscope cantilever position at a zero sensor position.
7. The method of claim 1 wherein said first resonance frequency is not the lowest resonance frequency of said MEMS actuator.
8. The method of claim 1 wherein a frequency difference between said first and said second resonance frequency is on the order of several hertz.
9. A method for determining a spring constant of a scanning probe microscope cantilever mechanically coupled to a MEMS motor rotor comprising:
determining a second resonance frequency of said MEMS motor rotor while a scanning probe tip mechanically coupled to said scanning probe microscope cantilever is in contact with a surface;
determining a first resonance frequency of said MEMS motor rotor while said scanning probe tip mechanically coupled to said scanning probe microscope cantilever is not in contact with said surface; and
calculating said spring constant using said first and said second resonance frequency.
10. The method of claim 9 wherein said MEMS motor rotor is an electrostatic MEMS drive motor rotor.
11. The method of claim 9 wherein said scanning probe tip is brought into contact with said surface by lowering said MEMS motor rotor.
12. The method of claim 11 further comprising keeping said scanning probe microscope cantilever position at a zero sensor position.
13. The method of claim 9 wherein said surface is lowered such that said scanning probe microscope probe tip is not in contact with said surface.
14. The method of claim 9 wherein a frequency difference between said first and said second resonance frequency is on the order of several hertz.
15. A method for determining a spring constant of a scanning probe microscope cantilever mechanically coupled to an electrostatic comb drive rotor comprising:
determining a second resonance frequency of said electrostatic comb drive rotor while a scanning probe tip mechanically coupled to said scanning probe microscope cantilever is in contact with a surface;
determining a first resonance frequency of said electrostatic comb drive rotor while said scanning probe tip mechanically coupled to said scanning probe microscope cantilever is not in contact with said surface; and
calculating said spring constant using said first and said second resonance frequency.
16. The method of claim 15 wherein said first resonance frequency is not the lowest resonance frequency of said electrostatic comb drive rotor.
17. The method of claim 15 wherein said scanning probe tip is brought into contact with said surface by lowering said electrostatic comb drive rotor.
18. The method of claim 15 wherein said surface is lowered such that said scanning probe microscope probe tip is not in contact with said surface.
19. The method of claim 15 wherein a frequency difference between said first and said second resonance frequency is on the order of several hertz.