Microscope objective
View Patent ↗A microscope objective including an front optical element, a plurality of optical elements spaced apart from the front element and from each other, as well as an adjusting unit. At least one of the optical elements can be displaced along the optical axis by the adjusting unit to adjust the focus of the objective. The focus of the objective is displaced relative to the front element along the optical axis and/or a temperature-induced imaging error of the objective is compensated for.
1. A microscopy method, which uses a microscope objective in a computer controlled laser scanning or immersion microscope, the microscope objective comprising an optical front element and a plurality of optical elements spaced apart from the front element and from each other, comprising:
controlling the adjusting unit with a controller such that the adjusting unit displaces at least one of the optical elements by motion of the adjusting unit in a direction along the optical axis of the microscope objective such that a relative distance between at least two of the plurality of optical elements is changed to modify a focus relative to the front element along the optical axis substantially without altering the working distance between the front element and a microscope sample to effect optical sections within the sample according to a predetermined depth profile; and
selecting the predetermined depth profile to be a periodic profile.
2. The method as claimed in claim 1 , further comprising displacing the at least one optical element such that two distances between spaced-apart optical elements are modified independently of one another.
3. A microscopy method, which uses a microscope objective in a computer controlled laser scanning or immersion microscope, the microscope objective comprising an optical front element and a plurality of optical elements spaced apart from the front element and from each other, comprising:
controlling the adjusting unit with a controller such that the adjusting unit displaces at least one of the optical elements by motion of the adjusting unit in a direction along the optical axis of the microscope objective such that a relative distance between at least two of the plurality of optical elements is changed to modify a focus relative to the front element along the optical axis substantially without altering the working distance between the front element and a microscope sample to effect optical sections within the sample according to a predetermined depth profile; and
repeating the predetermined depth profile such that optical sections are obtained at the same depths in different samples.
4. The method as claimed in claim 3 , further comprising displacing the at least one optical element such that two distances between spaced-apart optical elements are modified independently of one another.