Method, device and system for evaluating a lens for an electronic device
View Patent ↗The invention relates to a system, method and device for evaluating imperfections in a lens for a display for an electronic device. For the device, it comprises: a substrate; and a pattern imposed on the substrate. For the pattern, when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens. For the system, it comprises: an evaluation table for the lens, the table having a mounting area; and a substrate for mounting on the mounting area, the substrate having a pattern imposed thereon wherein when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens.
1. An evaluation device for visually identifying imperfections in a lens for mounting in a case to cover a display of an electronic device, said evaluation device comprising:
a substrate; and
a pattern imposed on the substrate wherein when said pattern is viewed through said lens, said pattern is distorted around an area where a defect is present in said lens,
wherein
the lens is identifiable as being defective if said pattern appears as a moiré distortion in said area when viewed through said lens; and
the lens is suitable for mounting in the case if said pattern appears to be a grey color when viewed through said lens.
2. The evaluation device of claim 1 , wherein:
said substrate is comprised of a transparent material; and
said pattern is a series of lines shown in a dark colour.
3. The evaluation device of claim 2 , wherein said series of lines is a grid having lines approximately 50 microns thick, spaced in approximately 100 micron intervals from center to center.
4. The evaluation device of claim 2 , wherein said series of lines is a grid having lines having thickness of between approximately 10 to approximately 150 microns, spaced in intervals between approximately 20 microns and approximately 300 microns from center to center.
5. The evaluation device of claim 1 , wherein:
said substrate is comprised of an opaque material in a light colour; and
said pattern is a series of lines shown in a dark colour.
6. The evaluation device of claim 5 , wherein said series of lines is a grid having lines approximately 50 microns thick, spaced in approximately 100 micron intervals from center to center.
7. The evaluation device of claim 5 , wherein said series of lines is a grid having lines having thickness of between approximately 10 to approximately 150 microns, spaced in intervals between approximately 20 microns and approximately 300 microns from center to center.
8. The evaluation device of claim 1 , wherein said pattern is a series of geometric shapes, each having dimensions of between approximately 10 and approximately 150 microns.
9. An evaluation system to visually evaluate a lens that mounts in a case to cover a display of an electronic device for imperfections, said system comprising:
an evaluation table for said lens, said table having a mounting area for an evaluation substrate; and
said substrate having a pattern imposed thereon wherein when said pattern is viewed through said lens, said pattern is seen to be distorted around an area where a defect is present in said lens,
wherein
said lens is identifiable as being defective if said pattern appears as a moiré distortion in said area when viewed through said lens; and
said lens is suitable for mounting in the case if said pattern appears to be a grey color when viewed through said lens.
10. The evaluation system of claim 9 , wherein said evaluation table further comprises:
a light mounted within said table to provide backlighting for said substrate; and
a guide rail system for said lens to place said lens above said mounting area.
11. The evaluation system of claim 10 , further comprising a conveyor for said lens to selectively transport said lens to and from said mounting area.
12. The evaluation system of claim 10 , wherein:
said substrate is comprised of a transparent material; and
said pattern is a series of lines shown in a dark colour.
13. The evaluation system of claim 11 , wherein said series of lines is a grid having lines having thickness of between approximately 10 and approximately 150 microns and the lines are spaced between approximately 20 and approximately 150 microns apart.
14. The evaluation system of claim 9 , wherein said pattern is a series of geometric shapes, each having dimensions of between approximately 10 and approximately 150 microns.
15. A method for visually evaluating a lens that mounts in a case to cover a display of an electronic device for imperfections, said method comprising:
prior to mounting the lens in the case, placing the lens under evaluation over an evaluation substrate having an evaluation pattern;
examining an image of the evaluation pattern appearing through the lens for a distortion in the pattern;
identifying the lens as defective if the distortion appears to be a moiré distortion in the evaluation pattern; and
mounting the lens in the case if no distortion is found and the a moiré distortion in the evaluation pattern,
wherein
said evaluation pattern comprises a series of lines having a thickness of approximately 50 microns;
said image appears to be a grey background on the substrate when viewed with an unaided eye or through said lens when no noteable imperfection exists in said lens; and
said distortion appears to be a moiré distortion pattern when viewed through said lens.
16. The method of claim 15 , wherein said series of lines is a grid having lines having thickness of between approximately 10 and approximately 150 microns and the lines are spaced between approximately 20 and approximately 150 microns apart.
17. The method of claim 15 , wherein the substrate is a clear mylar sheet, a piece of glass, or a clear or bright piece of plastic.