IP Library Granted Patent US 7,474,503
Granted Patent B2
US 7,474,503 · App. 11/466,475 · Granted Jan 6, 2009

Thin film magnetic head wafer with identification information

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Quick Facts
Patent No.
US 7,474,503
App. No.
11/466,475
Granted
Jan 6, 2009
Kind
B2
Abstract

A thin-film magnetic head wafer includes a first principal surface and a second principal surface which are substantially parallel to each other. An electrical/magnetic transducer is provided on the first principal surface. Identification information is recorded on the first principal surface of the wafer.

Claims (23)

1. A thin-film magnetic head wafer comprising:

a first principal surface for supporting an electrical/magnetic transducer;

a second principal surface which is substantially parallel to the first principal surface; and

an insulating film for separating the electrical/magnetic transducer from the first principal surface of the wafer, the insulating film covering the first principal surface of the wafer and having a flat surface; wherein

identification information that is unique to the wafer is recorded on the first principal surface of the wafer; and

the identification information is fully covered by the insulating film.

2. The wafer of claim 1 , wherein the identification information is located on a plurality of areas on the first principal surface of the wafer, mutually different portions of the identification information being allocated to the respective areas.

3. The wafer of claim 2 , wherein the areas are arranged so as to define respective thin-film magnetic heads when the wafer is divided.

4. The wafer of claim 1 , wherein an alignment mark is formed on the wafer.

5. The wafer of claim 1 , wherein the insulating film is made of alumina.

6. The wafer of claim 1 , wherein the identification information is represented by at least one of a pattern of concave portions and a pattern of convex portions that have been arranged on the first principal surface of the wafer.

7. The wafer of claim 1 , wherein the identification information is represented by a metal pattern that is provided on the first principal surface of the wafer.

8. The wafer of claim 1 , wherein the wafer is made of alumina titanium carbide.

9. The wafer of claim 1 , wherein the identification information is located in an area of the first principal surface such that light radiated toward the wafer to read the identification information is able to reach the area.

10. The wafer of claim 2 , wherein each of the portions of the information allocated to the respective areas is recorded within a recording region that is included in a substantially rectangular area of about 300 μm square.

11. The wafer of claim 1 , wherein the wafer has a thickness of about 400 μm to about 1,200 μm.

12. A magnetic head comprising:

a chip substrate comprising a divided portion of the thin-film magnetic head wafer of claim 1 ; and

an electrical/magnetic transducer provided on the chip substrate.

13. A recording medium drive comprising:

a magnetic head including a chip substrate and an electrical/magnetic transducer, the chip substrate comprising a divided portion of the thin-film magnetic head wafer of claim 1 , the electrical/magnetic transducer being provided on the chip substrate;

a recording medium with a magnetic recording film, from and on which information is read and written by the magnetic head; and

a motor for driving the recording medium.

Assignments (3)
MERGER Recorded Apr 30, 2008
From: NEOMAX CO., LTD.
To: HITACHI METALS, LTD.
Reel/Frame 020960/0162 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 29, 2008
From: HIROOKA, TAISUKE
To: SUMITOMO SPECIAL METALS CO., LTD.
Reel/Frame 020581/0015 →
CHANGE OF NAME Recorded Feb 29, 2008
From: SUMITOMO SPECIAL METALS CO., LTD.
To: NEOMAX CO., LTD.
Reel/Frame 020581/0029 →