Frequency stability measuring apparatus
View Patent ↗A frequency stability measuring apparatus for measuring a frequency fluctuation of a signal outputted from a given signal source includes: a reference signal output unit that outputs a reference frequency signal; a mixer that mixes a signal outputted from the signal source with the reference frequency signal outputted from the reference signal output unit and outputs a resultant signal; a filter that allows a low-frequency component of the signal outputted from the mixer to pass therethrough; a waveform-shaping circuit that shapes a waveform of a signal outputted from the filter; a counter that counts a number of pulses of a signal shaped by the waveform-shaping circuit; and a control unit that calculates average frequencies of the signal outputted from the filter within respective measurement periods of a predetermined length, and calculates and outputs a standard deviation of the average frequencies calculated
1. A frequency stability measuring apparatus for measuring a frequency fluctuation of a signal outputted from a given signal source, the apparatus comprising:
a reference signal output unit that outputs a reference frequency signal;
a mixer that mixes a signal outputted from the signal source with the reference frequency signal outputted from the reference signal output unit and outputs a resultant signal;
a filter that allows a low-frequency component of the signal outputted from the mixer to pass therethrough;
a waveform-shaping circuit that shapes a waveform of a signal outputted from the filter;
a counter that counts a number of pulses of a signal shaped by the waveform-shaping circuit; and
a control unit that calculates average frequencies of the signal outputted from the filter within respective measurement periods of a predetermined length, and calculates and outputs a standard deviation of the average frequencies calculated,
wherein the waveform-shaping circuit includes an amplifier that amplifies a waveform of the signal outputted from the filter and an amplitude limiter circuit that limits an amplitude of a signal outputted from the amplifier,
wherein a slew rate of the signal inputted to the counter in a predetermined gate time is set close to a saturation point of a frequency resolution of the counter, and
wherein the slew rate of the waveform-shaping circuit is set in a range of 0.1 V/μs to 100 V/μs.
2. The frequency stability measuring apparatus according to claim 1 , wherein the waveform-shaping circuit comprises:
a first resistance that has an input, which is connected to an output of the filter, and an output;
an operational amplifier that has a non-inverting input, which is connected to the output of the first resistance, and an output that is connected to an input of the counter;
a second resistance that is connected to the non-inverting input and to the output of the operational amplifier;
a first Zener diode that has an input, which is connected to the non-inverting input, and an output; and
a second Zener diode that has an input, which is connected to the output of the first Zener diode, and an output that is connected to the output of the operational amplifier and to the input of the counter.