IP Library Granted Patent US 7,322,248
Granted Patent B1
US 7,322,248 · App. 11/467,936 · Granted Jan 29, 2008

Pressure gauge for organic materials

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Quick Facts
Patent No.
US 7,322,248
App. No.
11/467,936
Granted
Jan 29, 2008
Kind
B1
Abstract

A vacuum gauge of the Pirani type for measuring the pressure of vaporized organic or inorganic material used in forming a layer of a device, comprising: an extended filament having a thickness of 5 microns or less and having a temperature coefficient of resistance greater than 0.0035/° C., the filament being subject to the vaporized organic or inorganic material; means for applying a current to the filament so that the temperature of the filament is less than 650° C. so as not to degrade the molecular structure of the organic material; and a structure responsive to a change in resistance or a change in current to determine heat loss from the filament, which is a function of the pressure of the vaporized organic or inorganic material.

Claims (11)

1. A vacuum gauge of the Pirani type for measuring the pressure of vaporized organic or inorganic material used in forming a layer of a device, comprising:

a) an extended filament having a thickness of 5 microns or less and having a temperature coefficient of resistance greater than 0.0035/° C., the filament being subject to the vaporized organic or inorganic material;

b) means for applying a current to the filament so that the temperature of the filament is less than 650° C. so as not to degrade the molecular structure of the organic material; and

c) means responsive to a change in resistance or a change in current to determine heat loss from the filament, which is a function of the pressure of the vaporized organic or inorganic material.

2. The vacuum gauge of claim 1 wherein the filament is helically wound.

3. The vacuum gauge of claim 2 wherein the helically wound filament is further formed into a second helix.

4. The vacuum gauge of claim 3 wherein the helically wound filament has an apparent length of greater than 1 cm.

5. The vacuum gauge of claim 1 wherein the current applying means is a constant current source.

6. The vacuum gauge of claim 1 wherein the current applying means further includes a circuit for maintaining a constant filament temperature.

7. The vacuum gauge of claim 1 wherein the filament is made from tungsten, molybdenum, nickel, platinum, copper, iron, or alloys thereof which have the required temperature coefficient of resistance.

8. The vacuum gauge of claim 1 wherein the filament has a thickness of 4 microns or less.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2010
From: EASTMAN KODAK COMPANY
To: GLOBAL OLED TECHNOLOGY LLC
Reel/Frame 023998/0368 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2006
From: LONG, MICHAEL
To: EASTMAN KODAK COMPANY
Reel/Frame 018183/0016 →