Open offset canceling method and an impedance measuring apparatus using the method
View Patent ↗A method for finding the impedance of a device under test using an impedance measuring apparatus having a modem-type auto-balancing bridge, two or more measurement signals, each of which has a different phase with respect to the reference signals supplied to the modem inside said auto-balancing bridge, are applied to a device under test; the impedance of this device under test is measured when each of the measurement signals is applied to the device under test; and the impedance of this device under test is found using the above-mentioned phase and the impedance measurement value of each of these measurements.
1. A method for measuring the impedance of a device under test using an impedance measuring apparatus having a modem-type auto-balancing bridge, said method comprising:
applying to said device under test two or more measurement signals, each of which is a different phase with respect to the same local signal inside said modem-type auto-balancing bridge;
measuring the impedance of said device under test when each of said measurement signals is applied to this device under test; and
finding the impedance of said device under test using the impedance measured values and said phase in each of said measurements.
2. The method according to claim 1 , wherein said measurement signals applied to said device under test are two signals, each of which has a phase that is the opposite of the other with respect to said local signal.
3. The method according to claim 1 , further comprising measuring the phase of each of the measurement signals with respect to said local signal.
4. An impedance measuring apparatus having a modem-type auto-balancing bridge, said impedance measuring apparatus comprising:
a signal source for generating two or more measurement signals, each of which has a different phase with respect to the same local signal inside said modem-type auto-balancing bridge; and
an arithmetic unit for finding the impedance of said device under test using the above-mentioned phase and the impedance measurement value of said device under test when each of said measurement signals is applied to said device under test.
5. The impedance measuring apparatus according to claim 4 , wherein said measurement signals applied to said device under test are two signals, each of which has phase that is the opposite of the other with respect to said local signal.
6. The impedance measuring apparatus according to claim 4 , further comprising a device for measuring the phase of said measurement signals with respect to said local signal.