III-nitride enhancement mode devices
View Patent ↗A III-nitride power semiconductor device that includes a nitrogen polar active heterojunction having a two-dimensional electron gas and including a first III-nitride semiconductor body by one band gap and a second III-nitride body having another band gap over the first III-nitride semiconductor body, a gate arrangement, a gate barrier under the gate arrangement thereof, a first power electrode and a second power electrode, and a method for fabricating the device.
1. A power semiconductor device comprising:
a substrate;
a nitrogen polar active heterojunction having a two dimensional electron gas that includes a first III-nitride semiconductor body having one band gap, and a second III-nitride semiconductor body having another band gap over said first III-nitride semiconductor body;
a gate arrangement coupled to at least said second III-nitride semiconductor body;
a gate barrier interposed between said gate arrangement and said second III-nitride semiconductor body to provide an added potential to pull a conduction band above a Fermi level thereof to interrupt said two dimensional electron gas when said gate arrangement is not biased; and
a first power electrode and a second power electrode coupled to at least said second III-nitride semiconductor body;
wherein said another band gap of said second III-nitride semiconductor body is smaller than said one band gap of said first III-nitride semiconductor body.
2. The power semiconductor device of claim 1 , further comprising a III-nitride buffer layer and a bonding layer between said III-nitride buffer layer and said substrate.
3. The power semiconductor device of claim 2 , wherein said substrate is comprised of silicon and said bonding layer is comprised of silicon dioxide.
4. The power semiconductor device of claim 3 , wherein said III-nitride buffer layer is comprised of GaN.
5. The power semiconductor device of claim 1 , wherein said gate barrier is comprised of an alloy of InAlGaN.
6. The power semiconductor device of claim 1 , wherein said gate barrier is comprised of AlGaN.
7. A power semiconductor device comprising:
a substrate;
a nitrogen polar buffer layer over said substrate;
a first III-nitride semiconductor body over said nitrogen polar buffer layer and a second III-nitride semiconductor body over said first III-nitride semiconductor body;
a two dimensional electron gas formed at a heterojunction of said first III-nitride semiconductor body and said second III-nitride semiconductor body;
a gate arrangement coupled to said second III-nitride semiconductor body;
a gate barrier interposed between said gate arrangement and said second III-nitride semiconductor body to provide an added potential to pull a conduction band above a Fermi level thereof to interrupt said two dimensional electron gas when said gate arrangement is not biased; and
a first power electrode and a second power electrode coupled to said second III-nitride semiconductor body;
wherein said first III-nitride semiconductor body has one band gap and said second III-nitride semiconductor body has another band gap, said another band gap being smaller than said one band gap.
8. The power semiconductor device of claim 7 , further comprising a bonding layer between said substrate and said nitrogen polar buffer layer.
9. The power semiconductor device of claim 7 , wherein said heterojunction is a nitrogen polar active heterojunction.
10. The power semiconductor device of claim 7 , wherein said nitrogen polar buffer layer comprises GaN.
11. The power semiconductor device of claim 7 , wherein said gate barrier comprises an alloy of InAlGaN.
12. The power semiconductor device of claim 7 , wherein said gate barrier comprises AlGaN.
13. The power semiconductor device of claim 8 , wherein said bonding layer comprises silicon dioxide.