IP Library Granted Patent US 7,719,849
Granted Patent B2
US 7,719,849 · App. 11/482,435 · Granted May 18, 2010

Multiple access test points

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,719,849
App. No.
11/482,435
Granted
May 18, 2010
Kind
B2
Abstract

Included are systems and methods for providing access of test points. An embodiment of a system includes an electrical module including at least one electrical circuit configured to communicate at least one electrical signal, the electrical module further including at least one multiple access test point configured to provide access for measurements of the electrical circuit. Some embodiments include an environmental housing that includes at least one access port, the environmental housing configured to receive the electrical module such that at least one access port provides access to at least one multiple access test point.

Claims (47)

1. A system for providing access to test points, comprising:

an electrical module including at least one electrical circuit, the electrical circuit configured to communicate at least one electrical signal, the electrical module further including a multiple access test point configured to provide access for measurements of the electrical circuit; and

an environmental housing configured to enclose the electrical module the environmental housing comprising:

a first access port located in the housing to provide access to the multiple access test point from outside the environmental housing; and

a second access port located in the housing at a spaced apart location from the first access port to provide access to the multiple access test point from outside the environmental housing, the second access port being substantially coaxial with and located at an opposing side of the environmental housing relative to the first access port.

2. The system of claim 1 , wherein the environmental housing includes a housing lid and a housing base.

3. The system of claim 2 , wherein the first access port is located in the housing base and the second access port is located in the housing lid.

4. The system of claim 1 , wherein the multiple access test point comprises:

a circuit connection electrically connected to at least one electrical circuit;

a first ground contact substantially aligned with the circuit connection; and

a second ground contact substantially aligned with the circuit connection.

5. The system of claim 1 , wherein the electrical module includes at least one circuit board configured to implement at least a portion of the electrical circuit, the circuit board further configured to include at least a first side and a second side.

6. The system of claim 5 , wherein the multiple access test point is electrically connected to the circuit board.

7. The system of claim 6 , wherein the multiple access test point includes:

a connection pin configured to extend from the first side and the second side of the circuit board;

a first ground contact located on the first side of the circuit board and substantially aligned with the connection pin; and

a second ground contact located on the second side of the circuit board and substantially aligned with the connection pin.

8. The system of claim 7 , wherein the second access port provides access to the second ground contact of the at least one multiple access test point.

9. A system for providing access to test points, comprising:

a circuit board configured to facilitate operation of at least a portion of an electrical circuit, the circuit board including a first side and a second side;

a chassis coupled to the circuit board;

a connection pin configured to extend from the first side and the second side of the circuit board; and

a ground contact electrically isolated from the connection pin having respective portions that extend from the first side and the second side of the circuit board and aligned substantially parallel with the connection pin, wherein the ground contact further comprises:

a grounding can that circumscribes a first portion of the connection pin extending from the first side of the circuit board; and

a plurality of extensions that extend through openings in the circuit board in a distributed relationship around a second portion of the connection pin extending from the second side of the circuit board.

10. The system of claim 9 , wherein the chassis is configured to provide the ground contact.

11. The system of claim 9 , wherein the chassis includes at least one opening to provide access to the ground contact.

12. A method for assembling an electrical unit including multiple access test points, comprising:

coupling a multiple access test point to an electrical module; and

disposing the electrical module in an environmental housing, the environmental housing comprising:

a first access port located in the housing to provide access to the multiple access test point from outside the environmental housing; and

a second access port located in the housing at a spaced apart location from the first access port to provide access to the multiple access test point from outside the environmental housing, the second access port being substantially coaxial with and located at an opposing side of the environmental housing relative to the first access port.

13. The method of claim 12 , wherein coupling at least one multiple access test point to the electrical module comprises:

electrically connecting the at least one multiple access test point to a circuit board; and

coupling the circuit board to a module chassis.

14. The method of claim 13 , further comprising electrically connecting the module chassis to a ground circuit of the circuit board.

15. The method of claim 13 , wherein coupling the circuit board to the module chassis includes substantially aligning at least one ground contact for at least one multiple access test port with an opening in the module chassis.

16. The method of claim 12 , wherein disposing the electrical module in the environmental housing includes substantially aligning the multiple access test point with the first and second access ports of the environmental housing.

17. A system for providing access to test points, comprising:

a circuit board configured to facilitate operation of at least a portion of an electrical circuit, the circuit board including a first side and a second side;

a chassis coupled to the circuit board;

a connection pin configured to extend from the first side and the second side of the circuit board; and a ground contact having respective portions that extend from the first side and the second side of the circuit board and aligned substantially parallel with the connection pin,

wherein the ground contact further comprises:

a first grounding can comprising a plurality of legs and slots; and

a second grounding can comprising a plurality of legs and slots;

wherein, the first grounding can circumscribes a first portion of the connection pin extending from the first side of the circuit board, the second grounding can circumscribes a second portion of the connection pin extending from the second side of the circuit board; and

wherein each of the plurality of legs of the first grounding can extends through an opening in the circuit board and into a corresponding slot of the second grounding can, and each of the plurality of legs of the second grounding can extend through an opening in the circuit board and into a corresponding slot of the first grounding can.

Assignments (4)
CHANGE OF NAME Recorded Nov 19, 2014
From: SCIENTIFIC-ATLANTA, INC.
To: SCIENTIFIC-ATLANTA, LLC
Reel/Frame 034299/0440 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2014
From: SCIENTIFIC-ATLANTA, LLC
To: CISCO TECHNOLOGY, INC.
Reel/Frame 034300/0001 →
CONVERSION OF BUSINESS ENTITY Recorded Jul 12, 2010
From: SCIENTIFIC-ATLANTA, INC.
To: SCIENTIFIC-ATLANTA, LLC
Reel/Frame 024662/0504 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 27, 2006
From: BLASHEWSKI, STEVEN E.; RIGGSBY, ROBERT R.; MAHONEY, WILLIAM G.
To: SCIENTIFIC-ATLANTA, INC.
Reel/Frame 018018/0812 →