Analytical method and apparatus
View Patent ↗A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface. According to the invention, part of the light reflected at said surface is detected on a second detector to determine the incident angle or wavelength of the polarized light irradiating the surface. An apparatus for carrying out the method is also disclosed.
1. An analytical system, comprising:
a sensor unit having a sensing surface with a number of individual zones,
means for illuminating the sensing surface with a collimated beam of light,
means for imaging reflected light from the illuminated sensing surface into an image plane,
means for repeatedly varying the incident angle and/or wavelength of the light incident at the sensing surface over an angular and/or wavelength range,
means for synchronized detection of images in the image plane and incident angle and/or wavelength of light illuminating the sensing surface, and
evaluation means for determining from the relationship between detected intensity of different parts of the images and incident light angle and/or wavelength, the optical thickness of each zone of the sensing surface,
wherein the evaluation means further are arranged to determine the relative phase of p- and s-polarized electric field components of the reflected light.
2. The system according to claim 1 , wherein the means for synchronized detection comprises integral photo-detector means.
3. The system according to claim 1 , wherein the means for varying the incident light and/or wavelength comprise beam deflecting means to produce an angle-scanned collimated illumination of the sensing surface.
4. The system according to claim 1 , wherein the sensing surface supports reactants capable of binding interaction with species in a sample.
5. The system according to claim 1 , wherein the system comprises a flow cell in contact with the sensing surface to expose the sensing surface to a sample solution.
6. The system according to claim 1 , wherein the collimated light beam is elliptically polarized.
7. The system according to claim 1 , wherein the system is based on total internal reflection versus angle and/or wavelength of incidence.
8. The system according to claim 7 , wherein the system is based on surface plasmon resonance.