IP Library Granted Patent US 7,828,955
Granted Patent B2
US 7,828,955 · App. 11/483,448 · Granted Nov 9, 2010

Ammonia gas sensors

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Quick Facts
Patent No.
US 7,828,955
App. No.
11/483,448
Granted
Nov 9, 2010
Kind
B2
Abstract

One embodiment of an ammonia gas sensor includes: a reference electrode, an ammonia selective sensing electrode and an electrolyte disposed therebetween. The sensing electrode comprises the reaction product of a main material selected from the group consisting of vanadium, tungsten, molybdenum, vanadium oxides, tungsten oxides, molybdenum oxides, and combinations comprising at least one of the foregoing main materials, and an electrically conducting material selected from the group consisting of electrically conductive metals, electrically conductive metal oxides, and combinations comprising at least one of the foregoing.

Claims (56)

1. An ammonia gas sensor, comprising:

an electrolyte;

a reference electrode in contact with the electrolyte; and

an ammonia selective sensing electrode in contact with the electrolyte spaced apart from the reference electrode, said ammonia selective sensing electrode composed of an oxide material characterized by the formula

A x M y O z

wherein M is selected from the group consisting of vanadium, tungsten, and molybdenum;

wherein A is one or more metals; and

wherein x, y and z are non-zero numbers indicative of the atomic proportion.

2. The ammonia gas sensor in accordance with claim 1 , wherein the electrolyte is composed of a material capable of electrochemical transfer of hydrogen ions.

3. The ammonia gas sensor in accordance with claim 2 , wherein the electrolyte is a zirconia composition.

4. The ammonia gas sensor in accordance with claim 3 , wherein the zirconia composition comprises zirconia containing an additive adapted to stabilize the zirconia at elevated temperatures.

5. The ammonia gas sensor in accordance with claim 4 , wherein the electrolyte is yttria-stabilized zirconia.

6. The ammonia gas sensor in accordance with claim 1 , wherein A includes a metal selected from the group consisting of bismuth, lead, lanthanum, strontium, calcium, copper, gadolinium, neodymium, yttrium, samarium, and magnesium.

7. The ammonia gas sensor of claim 6 , wherein A is between about 0.1 at % to about 15 at %.

8. The ammonia gas sensor of claim 6 , wherein A is between about 1 at % to about 10 at %.

9. The ammonia gas sensor of claim 6 , wherein A is between about 3 at % to about 8 at %.

10. The ammonia gas sensor in accordance with claim 1 , wherein the oxide material further comprises a chemically stabilizing dopant.

11. The ammonia gas sensor in accordance with claim 10 , wherein the chemically stabilizing dopant is selected from the group consisting of tantalum, niobium, and magnesium.

12. The ammonia gas sensor of claim 10 , wherein the chemically stabilizing dopant is between about 0.1 at % to about 5 at %.

13. The ammonia gas sensor of claim 10 , wherein the chemically stabilizing dopant is between about 0.3 at % to about 3 at %.

14. The ammonia gas sensor in accordance with claim 1 , wherein the oxide material further comprises a diffusion-impeding dopant.

15. The ammonia gas sensor in accordance with claim 14 , wherein the diffusion-impeding dopant is selected from the group consisting of zinc, zirconium, lead, iron, and yttrium.

16. The ammonia gas sensor in accordance with claim 1 ,

wherein M is vanadium; and

wherein A is selected from the group consisting of bismuth, lead, lanthanum, strontium, calcium, copper, gadolinium, neodymium, yttrium, samarium, magnesium, tin, antimony, neodymium, tantalum and chromium.

17. The ammonia gas sensor of claim 16 , wherein A comprises bismuth.

18. The ammonia gas sensor in accordance with claim 16 , wherein A further comprises a chemically stabilizing dopant selected from the group consisting of tantalum and magnesium.

19. The ammonia gas sensor in accordance with claim 16 , wherein A further comprises a diffusion-impeding dopant selected from the group consisting of zinc, zirconium, lead, iron, and yttrium.

20. A process for measuring the concentration of ammonia in a gas, the process comprising

providing an ammonia gas sensor comprising an electrolyte, a reference electrode in contact with the electrolyte; and an ammonia selective sensing electrode in contact with the electrolyte spaced apart from the reference electrode, said ammonia selective sensing electrode composed of an oxide material characterized by the formula

A x M y O z

wherein M is selected from the group consisting of vanadium, tungsten, and molybdenum;

wherein A is one or more metals; and

wherein x, y and z are non-zero numbers indicative of the atomic proportion;

contacting the gas with the ammonia selecting sensing electrode; and

measuring a voltage signal between said ammonia sensing electrode and said reference electrode.

21. The process in accordance with claim 20 , wherein the electrolyte is composed of a material capable of electrochemical transfer of hydrogen ions.

22. The process in accordance with claim 21 , wherein the electrolyte is a zirconia composition.

23. The process in accordance with claim 22 , wherein the zirconia composition comprises zirconia containing an additive adapted to stabilize the zirconia at elevated temperatures.

24. The process in accordance with claim 23 , wherein the electrolyte is yttria-stabilized zirconia.

25. The process in accordance with claim 20 , wherein A includes a metal selected from the group consisting of bismuth, lead, lanthanum, strontium, calcium, copper, gadolinium, neodymium, yttrium, samarium, and magnesium.

26. The process of claim 20 , wherein A is between about 0.1 at % to about 15 at %.

27. The process of claim 20 , wherein A is between about 1 at % to about 10 at %.

28. The process of claim 20 , wherein A is between about 3 at % to about 8 at %.

29. The process in accordance with claim 20 , wherein A comprises a chemically stabilizing dopant.

30. The process in accordance with claim 20 , wherein the chemically stabilizing dopant is selected from the group consisting of tantalum, niobium, and magnesium.

31. The process of claim 30 , wherein the chemically stabilizing dopant is between about 0.1 at % to about 5 at %.

32. The process of claim 30 , wherein the chemically stabilizing dopant is between about 0.3 at % to about 3 at %.

33. The process in accordance with claim 20 , wherein A comprises a diffusion-impeding dopant.

34. The process in accordance with claim 33 , wherein the diffusion-impeding dopant is selected from the group consisting of zinc, zirconium, lead, iron, and yttrium.

35. The process in accordance with claim 20 ,

wherein M is vanadium; and

wherein A is selected from the group consisting of bismuth, lead, lanthanum, strontium, calcium, copper, gadolinium, neodymium, yttrium, samarium, magnesium, tin, antimony, neodymium, tantalum and chromium.

36. The process of claim 35 , wherein A is bismuth.

37. The process in accordance with claim 36 , wherein the oxide material further comprises a chemically stabilizing dopant selected from the group consisting of tantalum and magnesium.

38. The process in accordance with claim 36 , wherein the oxide material further comprises a diffusion-impeding dopant selected from the group consisting of zinc, zirconium, lead, iron, and yttrium.

Assignments (2)
CHANGE OF NAME Recorded Sep 18, 2024
From: DELPHI TECHNOLOGIES IP LIMITED
To: BORGWARNER US TECHNOLOGIES LLC
Reel/Frame 068985/0968 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 23, 2018
From: DELPHI TECHNOLOGIES, INC
To: DELPHI TECHNOLOGIES IP LIMITED
Reel/Frame 045113/0958 →