IP Library Granted Patent US 7,371,282
Granted Patent B2
US 7,371,282 · App. 11/484,691 · Granted May 13, 2008

Solid solution wide bandgap semiconductor materials

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Quick Facts
Patent No.
US 7,371,282
App. No.
11/484,691
Granted
May 13, 2008
Kind
B2
Abstract

A substrate and method for growing a semi-conductive crystal on an alloy film such as (AIN) x (SiC) (1-x) without any buffer layer is disclosed. The (AIN) x (SiC) (1-x) alloy film can be formed on a SiC substrate by a vapor deposition process using AlN and SiC powder as starting materials. The (AIN) x (SiC) (1-x) alloy film provides a better lattice match for GaN or SiC epitaxial growth and reduces defects in epitaxially grown GaN with better lattice match and chemistry.

Claims (24)

1. A method for producing a semiconductor crystal, comprising

depositing a semiconductor material on an alloy film by a vapor deposition method,

wherein the semiconductor material is selected from the group consisting of nitride, carbide and diamond, and wherein the alloy is (AIN) x (SiC) (1-x) or Si x Ge (1-x) C, where 0<x<1.

2. The method of claim 1 , wherein the vapor deposition method is selected from the group consisting of PVT, APVT, MOCVD and CVD.

3. The method of claim 2 , wherein the semiconductor material comprises GaN and the alloy comprises (AIN) x (SiC) (1-x) , and wherein the vapor deposition method is PVT.

4. The method of claim 1 , further comprising the step of:

forming the alloy film by a vapor deposition method on a substrate prior to depositing the semiconductor material.

5. The method of claim 4 , wherein the substrate is selected from the group consisting of carbon, silicon and SiC.

6. The method of claim 5 , wherein the substrate comprises SiC.

7. The method of claim 6 , wherein the substrate comprises a on-axis 6H—SiC.

8. The method of claim 5 , wherein the substrate comprises SiC and the alloy film comprises (AIN) x (SiC) (1-x) , formed by PVT, APVT, MOCVD or CVD.

9. The method of claim 4 , further comprising the step of:

doping the substrate prior to forming the alloy film on the substrate.

10. The method of claim 9 , wherein the substrate comprises SiC and is doped with ammonia or trimethyl aluminum in an MOCVD process.

11. The method of claim 4 , further comprising the step of:

treating the substrate with hexamethyldisilizane and ammonia prior to forming the alloy film on the substrate.

12. The method of claim 1 , wherein the semiconductor material comprises SiC and the alloy comprises (AIN) x (SiC) (1-x) .

13. The method of claim 1 , wherein the semiconductor material comprises diamond and the alloy comprises (AIN) x (SiC) (1-x) .

14. A method for producing a AlN-rich (AlN) x (SiC) (1-x) alloy film on a substrate, comprising:

depositing AlN and SiC on a substrate to form an (AlN) x (SiC) (1-x) alloy in a PVT process under a background pressure of less than 100 torr using AlN and SiC powder as starting materials.

15. The method of claim 14 , wherein the substrate comprises doped SiC.

16. A method for producing a SiC-rich (AlN) x (SiC) (1-x) alloy film on a substrate, comprising:

depositing AlN and SiC on a substrate to form an (AlN) x (SiC) (1-x) alloy in a PVT process under a background pressure of 400-500 torr using AlN and SiC powder as starting materials.

17. The method of claim 16 , wherein the substrate comprises doped SiC.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2011
From: NORTHROP GRUMMAN CORPORATION
To: NORTHROP GRUMMAN SYSTEMS CORPORATION
Reel/Frame 025597/0505 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2006
From: SINGH, NARSINGH BAHADUR; WAGNER, BRIAN; AUMER, MIKE; THOMSON, DARREN; KAHLER, DAVID; BERGHMANS, ANDRE; KNUTESON, DAVID
To: NORTHROP GRUMMAN CORPORATION
Reel/Frame 018101/0776 →