IP Library Granted Patent US 7,508,432
Granted Patent B2
US 7,508,432 · App. 11/488,961 · Granted Mar 24, 2009

CCD with improved substrate voltage setting circuit

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Quick Facts
Patent No.
US 7,508,432
App. No.
11/488,961
Granted
Mar 24, 2009
Kind
B2
Abstract

An image sensor includes a plurality of pixels for converting incident photons into electrical charge; an overflow drain to draw off excess charge from at one or more of the pixels; a mechanism for summing charge from two or more of the pixels; a first network of resistive devices generating a first overflow drain voltage where at least one of the resistive devices has, in parallel, a fuse that can be opened in response to an external stimulus to provide the optimum overflow drain voltage for pixel anti-blooming protection and saturation signal level for when a plurality of pixels are summed together; and a second network of resistive devices connected to the first network of resistive devices generating a second overflow drain voltage where the second overflow drain voltage is a fraction of the first overflow drain voltage and the second overflow drain voltage provides the optimum overflow drain voltage for pixel anti-blooming and saturation signal level for when none or substantially none of the plurality of pixels are summed together.

Claims (47)

1. An image sensor comprising:

(a) a plurality of pixels for converting incident photons into electrical charge;

(b) an overflow drain to draw off excess charge from at least one or more of the pixels;

(c) a mechanism for summing charge from two or more of the pixels;

(d) a first network of resistive devices generating a first overflow drain voltage where at least one of the resistive devices has, in parallel, a fuse that can be opened in response to an external stimulus to provide the optimum overflow drain voltage for pixel anti-blooming protection and saturation signal level for when a plurality of pixels are summed together; and

(e) a second network of resistive devices connected to the first network of resistive devices generating a second overflow drain voltage where the second overflow drain voltage is a fraction of the first overflow drain voltage and the second overflow drain voltage provides the optimum overflow drain voltage for pixel anti-blooming and saturation signal level for when none or substantially none of the plurality of pixels are summed together.

2. The image sensor of claim 1 , further comprising a plurality of additional networks of resistive devices.

3. The image sensor of claim 1 , wherein at least one of the resistive devices is a resistor.

4. The image sensor of claim 1 , wherein at least one of the resistive devices is a field effect transistor.

5. The image sensor of claim 1 , wherein at least one of the fuses is replaced by an anti-fuse.

6. The image sensor of claim 1 , wherein the plurality of pixels form a charge coupled device.

7. The image sensor of claim 1 , wherein the plurality of pixels are each connected directly to the gate of a field effect transistor or indirectly connected to the gate of a field effect transistor through a transfer gate and floating diffusion.

8. The image sensor of claim 1 , wherein the number of plurality of pixels summed together is 2.

9. The image sensor of claim 1 , wherein the number of plurality of pixels summed together is 3.

10. The image sensor of claim 1 , wherein the number of plurality of pixels summed together is 4.

11. The image sensor of claim 2 , wherein at least one of the resistive devices is a resistor.

12. The image sensor of claim 2 , wherein at least one of the resistive devices is a field effect transistor.

13. The image sensor of claim 2 , wherein at least one of the fuses is replaced by an anti-fuse.

14. The image sensor of claim 2 , wherein the plurality of pixels form a charge coupled device.

15. The image sensor of claim 2 , wherein the plurality of pixels are each connected directly to the gate of a field effect transistor or indirectly connected to the gate of a field effect transistor through a transfer gate and floating diffusion.

16. The image sensor of claim 2 , wherein the number of plurality of pixels summed together is 2.

17. The image sensor of claim 2 , wherein the number of plurality of pixels summed together is 3.

18. The image sensor of claim 2 , wherein the number of plurality of pixels summed together is 4.

19. A camera comprising:

an image sensor comprising:

(a) a plurality of pixels for converting incident photons into electrical charge;

(b) an overflow drain to draw off excess charge from at one or more of the pixels;

(c) a mechanism for summing charge from two or more of the pixels;

(d) a first network of resistive devices generating a first overflow drain voltage where at least one of the resistive devices has, in parallel, a fuse that can be opened in response to an external stimulus to provide the optimum overflow drain voltage for pixel anti-blooming protection and saturation signal level for when a plurality of pixels are summed together; and

(e) a second network of resistive devices connected to the first network of resistive devices generating a second overflow drain voltage where the second overflow drain voltage is a fraction of the first overflow drain voltage and the second overflow drain voltage provides the optimum overflow drain voltage for pixel anti-blooming and saturation signal level for when none or substantially none of the plurality of pixels are summed together.

20. The camera of claim 19 further comprising a plurality of additional networks of resistive devices.

21. The camera of claim 19 , wherein at least one of the resistive devices is a resistor.

22. The camera of claim 19 , wherein at least one of the resistive devices is a field effect transistor.

23. The camera of claim 19 , wherein at least one of the fuses is replaced by an anti-fuse.

24. The camera of claim 19 , wherein the plurality of pixels form a charge coupled device.

25. The camera of claim 19 , wherein the plurality of pixels are each connected directly to the gate of a field effect transistor or indirectly connected to the gate of a field effect transistor through a transfer gate and floating diffusion.

26. The camera of claim 19 , wherein the number of plurality of pixels summed together is 2.

27. The camera of claim 19 , wherein the number of plurality of pixels summed together is 3.

28. The camera of claim 19 , wherein the number of plurality of pixels summed together is 4.

29. The image sensor of claim 20 , wherein at least one of the resistive devices is a resistor.

30. The image sensor of claim 20 , wherein at least one of the resistive devices is a field effect transistor.

31. The image sensor of claim 20 , wherein at least one of the fuses is replaced by an anti-fuse.

32. The image sensor of claim 20 , wherein the plurality of pixels form a charge coupled device.

33. The image sensor of claim 20 , wherein the plurality of pixels are each connected directly to the gate of a field effect transistor or indirectly connected to the gate of a field effect transistor through a transfer gate and floating diffusion.

34. The image sensor of claim 20 , wherein the number of plurality of pixels summed together is 2.

35. The image sensor of claim 20 , wherein the number of plurality of pixels summed together is 3.

36. The image sensor of claim 20 , wherein the number of plurality of pixels summed together is 4.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2011
From: EASTMAN KODAK COMPANY
To: OMNIVISION TECHNOLOGIES, INC.
Reel/Frame 026227/0213 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2006
From: PARKS, CHRISTOPHER; MCCARTEN, JOHN P.
To: EASTMAN KODAK COMPANY
Reel/Frame 022938/0042 →