Apparatus and method for all-solid-state fluorescence lifetime imaging
View Patent ↗Fluorescence lifetime imaging microscopy (FLIM) is a powerful technique increasingly used in the life sciences during the past decades. An all-solid-state fluorescence-lifetime-imaging microscope ( 1 ) with a simple lock-in imager ( 4 ) for fluorescence lifetime detection is described. The lock-in imager ( 4 ), originally developed for 3D vision, embeds all the functionalities required for FLIM in a compact system. Its combination with a light-emitting diode ( 2 ) yields a cost-effective and user-friendly FLIM unit for wide-field microscopes. The system is suitable for nanosecond lifetime measurements and achieves video-rate imaging capabilities.
1. An apparatus for imaging a luminescent sample, comprising:
a radiation source arranged to illuminate the sample with excitation radiation,
driving electronics for modulating an intensity of the excitation radiation,
a collimating lens for collimating the excitation radiation,
a lens for focusing the collimated excitation radiation towards the luminescent sample,
an optical output port,
a plurality of pixels arranged behind said optical output port for detecting luminescent radiation emitted by the sample, and
driving circuitry for controlling the mutual phase relation of the radiation source and said plurality of pixels,
wherein at least one pixel of said plurality of pixels comprises:
a radiation-sensitive element for converting incident radiation into an electric signal,
at least one storage element for storing the electric signal, and
gate electrodes for transferring the electric signal from the radiation-sensitive element to a selected one of the storage elements, wherein
the apparatus further comprises: active-pixel-sensor (APS) readout architecture for individually reading out the electric signal stored in the at least one storage element of said at least one pixel.
2. The apparatus according to claim 1 , wherein said at least two gate electrodes are connected to said driving circuitry.
3. The apparatus according to claim 1 , each gate electrode having a connection for applying an electric potential for generating a lateral electric drift field at a surface of said plurality of pixels.
4. The apparatus according to claim 1 , wherein the storage elements are integration gates.
5. The apparatus according to claim 1 , wherein said APS readout architecture is allocated to each storage element, and comprise readout lines, each readout line being allocated to a sense node.
6. The apparatus according to claim 1 , wherein each pixel of said plurality of pixels comprises at least one storage element.
7. The apparatus according to claim 1 , wherein said radiation source, said driving electronics, said plurality of pixels said driving circuitry and said APS architecture are integrated on one single circuit board.
8. The apparatus according to claim 1 , further comprising a microscope for imaging the sample onto said plurality of pixels.
9. A method for imaging a luminescent sample, comprising the steps of:
illuminating the sample with excitation radiation intensity-modulated with a modulation frequency, and
periodically detecting in a plurality of pixels luminescent radiation emitted by the sample, synchronously with the modulation frequency of the intensity-modulated radiation, characterized in that the detection step comprises the partial steps of:
converting incident radiation into an electric signal,
providing at least one storage element in at least one pixel,
selecting one of the at least one storage element,
storing the electric signal in said selected storage element,
wherein the storing of the electric signal is controlled to have a predetermined phase relation with respect to the intensity modulation of the excitation radiation,
wherein each period of the intensity-modulated radiation is divided into a predetermined number of time intervals,
wherein one of the at least one storage element is allocated to each time interval, and
wherein in each time interval, the electric signal is stored in the storage element corresponding to the actual time interval, and
individually reading out the electric signals stored in the at least one storage element of said at least one pixel.
10. The apparatus according to claim 1 , wherein said gate electrodes
comprise a connection for applying an electric potential for generating a lateral electric drift field at a surface of said plurality of pixels;
the storage elements are integration gates;
said APS architecture comprising readout lines, each readout line being allocated to a sense node;
each pixel of said plurality of pixels comprises at least one storage element;
the radiation source, said driving electronics, said plurality of pixels, and said APS architecture are integrated on one single circuit board; and wherein
a microscope is provided for imaging the sample onto said plurality of pixels.
11. The method according to claim 9 , wherein:
the stored electric signals are read out, and demodulation and/or phase delay parameters are calculated from the electric signals;
the luminescent radiation is decomposed into its spectral components, and at least one of the components is detected so as to obtain information on spectrally-resolved lifetimes of the luminescent radiation.