IP Library Granted Patent US 7,296,476
Granted Patent B2
US 7,296,476 · App. 11/495,317 · Granted Nov 20, 2007

Microelectromechanical system pressure sensor and method for making and using

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Quick Facts
Patent No.
US 7,296,476
App. No.
11/495,317
Granted
Nov 20, 2007
Kind
B2
Abstract

According to some embodiments, an apparatus includes a substrate that defines a plane. The apparatus also includes a first conducting plate that is substantially normal to the substrate and a second conducting plate that is (i) substantially normal to the substrate and (ii) deformable in response to a pressure.

Claims (14)

1. An apparatus, comprising:

a substrate defining a first plane;

a first finger, including a first pair of conducting plates, wherein at least one of the conducting plates is substantially normal to the substrate and deformable in response to pressure, and wherein a vacuum is provided between the first pair of conducting plates; and

a second finger, including a second pair of conducting plates, wherein at least one of the conducting plates is substantially normal to the substrate and deformable in response to pressure, and wherein a vacuum is provided between the second pair of conducting plates.

2. The apparatus of claim 1 , wherein the first pair of conducting plates is electrically isolated from the second pair of conducting plates.

3. The apparatus of claim 2 , wherein pressure is to be measured based at least in part on capacitance between the fingers.

4. The apparatus of claim 3 , wherein (i) the first finger is part of a first comb having a plurality of fingers that are electrically coupled to each other, and (ii) the second finger is part of a second comb having a plurality of fingers that are electrically coupled to each other and electrically isolated from the fingers of the first comb.

5. The apparatus of claim 4 , wherein fingers of the first are second combs are interleaved.

6. The apparatus of claim 5 , wherein the combs form an array of capacitors connected in parallel.

7. The apparatus of claim 3 , wherein the measured pressure is an absolute pressure.

8. The apparatus of claim 3 , wherein at least one of the conducting plates is deformable in response to a first pressure and at least one of the conducting plates is deformable in response to a second pressure, and wherein the measured pressure is associated with the difference between the first and second pressures.

9. The apparatus of claim 3 , wherein an increase in pressure is associated with a decrease in capacitance.

10. The apparatus of claim 3 , wherein an increase in pressure increases a distance between one of the conducting plates of the first finger and one of the conducting plates of the second finger.

11. The apparatus of claim 3 , wherein air acts as a dielectric associated with the capacitance.

Assignments (3)
CHANGE OF NAME Recorded Apr 25, 2014
From: GE THERMOMETRICS, INC.
To: AMPHENOL THERMOMETRICS, INC.
Reel/Frame 032763/0141 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2014
From: AMPHENOL CORPORATION
To: GE THERMOMETRICS, INC.
Reel/Frame 032745/0924 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2014
From: GENERAL ELECTRIC COMPANY
To: AMPHENOL CORPORATION
Reel/Frame 032679/0265 →