IP Library Granted Patent US 7,305,889
Granted Patent B2
US 7,305,889 · App. 11/495,318 · Granted Dec 11, 2007

Microelectromechanical system pressure sensor and method for making and using

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Quick Facts
Patent No.
US 7,305,889
App. No.
11/495,318
Granted
Dec 11, 2007
Kind
B2
Abstract

According to some embodiments, an apparatus includes a substrate that defines a plane. The apparatus also includes a first conducting plate that is substantially normal to the substrate and a second conducting plate that is (i) substantially normal to the substrate and (ii) deformable in response to a pressure.

Claims (13)

1. A method, comprising:

on a wafer that includes a first non-conducting layer bonded onto a conducting layer, etching substantially parallel trenches through the layers to form a plurality of conducting plates substantially normal to a plane defined by the wafer, wherein at least one conducting plate is to be deformable in response to pressure; and

bonding a second non-conducting layer onto the first non-conducting layer.

2. The method of claim 1 , wherein pairs of conducting plates form fingers.

3. The method of claim 2 , wherein a first set of fingers is formed on a first comb and a second set of fingers is formed on a second comb, the fingers of the first and second combs being interleaved.

4. The method of claim 3 , further comprising:

etching away a portion of the second non-conducting layer and the first non-conducting layer to expose a portion of the conducting layer.

5. The method of claim 4 , further comprising:

creating a vacuum within a finger.

6. The method of claim 4 , further comprising:

bonding a cap wafer onto the second non-conducting layer.

7. The method of claim 6 , wherein the cap wafer includes at least one of: (i) a ground via, (ii) a voltage via, (iii) a first pressure via, and (iv) a second pressure via.

8. The method of claim 1 , wherein at least one pressure input cavity is formed while etching the trenches.

Assignments (3)
CHANGE OF NAME Recorded Apr 25, 2014
From: GE THERMOMETRICS, INC.
To: AMPHENOL THERMOMETRICS, INC.
Reel/Frame 032763/0141 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2014
From: AMPHENOL CORPORATION
To: GE THERMOMETRICS, INC.
Reel/Frame 032745/0924 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2014
From: GENERAL ELECTRIC COMPANY
To: AMPHENOL CORPORATION
Reel/Frame 032679/0265 →