Granted Patent B2

US 7,738,729 · App. 11/498,114 · Granted Jun 15, 2010

Abstract

Claims (110)

1. A method for reducing an artifact within an image of a substance, said method comprising:

generating the image of the substance;

generating at least one of a measured diffraction profile, a measured effective atomic number, and a measured packing fraction of the substance;

determining a pre-stored linear attenuation coefficient corresponding to at least one of a pre-stored diffraction profile, a pre-stored effective atomic number, and a pre-stored packing fraction; and

changing a measured linear attenuation coefficient of a pixel of the image to match the pre-stored linear attenuation coefficient.

2. A method in accordance with claim 1 further comprising:

generating the measured diffraction profile; and

determining a pre-stored diffraction profile that is closest to the measured diffraction profile.

3. A method in accordance with claim 1 further comprising:

generating the measured effective atomic number; and

determining a pre-stored effective atomic number that is closest to the measured effective atomic number of the substance.

4. A method in accordance with claim 1 further comprising:

generating the measured packing fraction; and

determining a pre-stored packing fraction that is closest to the measured packing fraction of the substance.

5. A method in accordance with claim 1 further comprising:

generating the measured diffraction profile;

determining a pre-stored diffraction profile that is closest to the measured diffraction profile; and

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored diffraction profile upon determining the pre-stored diffraction profile closest to the measured diffraction profile.

6. A method in accordance with claim 1 further comprising:

generating the measured effective atomic number;

determining a pre-stored effective atomic number that is closest to the measured effective atomic number of the substance; and

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored effective atomic number upon determining the pre-stored effective atomic number closest to the measured effective atomic number.

7. A method in accordance with claim 1 further comprising:

generating the measured packing fraction;

determining a pre-stored packing fraction that is closest to the measured packing fraction of the substance; and

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored packing fraction upon determining the pre-stored effective atomic number closest to the measured packing fraction.

8. A method in accordance with claim 1 further comprising:

generating the measured diffraction profile;

determining a pre-stored diffraction profile that is closest to the measured diffraction profile;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored diffraction profile upon determining the pre-stored diffraction profile closest to the measured diffraction profile; and

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient.

9. A method in accordance with claim 1 further comprising:

generating the measured effective atomic number;

determining a pre-stored effective atomic number that is closest to the measured effective atomic number;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored effective atomic number upon determining the pre-stored effective atomic number closest to the measured effective atomic number; and

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient.

10. A method in accordance with claim 1 further comprising:

generating the measured packing fraction;

determining a pre-stored packing fraction that is closest to the measured packing fraction;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored packing fraction upon determining the pre-stored packing fraction closest to the measured packing fraction; and

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient.

11. A method in accordance with claim 1 further comprising:

generating the measured diffraction profile;

determining a pre-stored diffraction profile that is closest to the measured diffraction profile;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored diffraction profile upon determining the pre-stored diffraction profile closest to the measured diffraction profile;

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient; and

changing the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel.

12. A method in accordance with claim 1 further comprising:

generating the measured effective atomic number;

determining a pre-stored effective atomic number that is closest to the measured effective atomic number;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored effective atomic number upon determining the pre-stored effective atomic number closest to the measured effective atomic number;

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient; and

changing the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel.

13. A method in accordance with claim 1 further comprising:

generating the measured packing fraction;

determining a pre-stored packing fraction that is closest to the measured packing fraction;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored packing fraction upon determining the pre-stored packing fraction closest to the measured packing fraction;

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient; and

changing the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel.

14. A method in accordance with claim 1 further comprising:

generating the measured diffraction profile;

determining the pre-stored diffraction profile that is closest to the measured diffraction profile;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored diffraction profile upon determining the pre-stored diffraction profile closest to the measured diffraction profile;

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient;

changing the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel; and

determining whether the measured linear attenuation coefficient of the pixel is less than zero upon determining that the pre-stored linear attenuation coefficient is equal to the measured linear attenuation coefficient of the pixel.

15. A method in accordance with claim 1 further comprising:

generating the measured diffraction profile;

determining a pre-stored diffraction profile that is closest to the measured diffraction profile;

determining the pre-stored linear attenuation coefficient corresponding to the pre-stored diffraction profile upon determining the pre-stored diffraction profile closest to the measured diffraction profile;

determining whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient;

changing the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel;

determining whether the measured linear attenuation coefficient of the pixel is less than zero upon determining that the pre-stored linear attenuation coefficient is equal to the measured linear attenuation coefficient of the pixel; and

replacing the measured linear attenuation coefficient of the pixel with zero upon determining that the measured linear attenuation coefficient of the pixel is less than zero.

16. A processor for reducing an artifact within an image of a substance, said processor configured to:

generate the image of the substance;

generate at least one of a measured diffraction profile, a measured effective atomic number, and a measured packing fraction of the substance;

determine a pre-stored linear attenuation coefficient corresponding to at least one of a pre-stored diffraction profile, a pre-stored effective atomic number, and a pre-stored packing fraction; and

change a measured linear attenuation coefficient of a pixel of the image to match the pre-stored linear attenuation coefficient.

17. A processor in accordance with claim 16 further configured to:

generate the measured effective atomic number;

determine a pre-stored effective atomic number that is closest to the measured effective atomic number;

determine a pre-stored linear attenuation coefficient corresponding to the pre-stored effective atomic number upon determining the pre-stored effective atomic number closest to the measured effective atomic number;

determine whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient;

change the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel; and

determine whether the measured linear attenuation coefficient of the pixel is less than zero upon determining that the pre-stored linear attenuation coefficient is equal to the measured linear attenuation coefficient of the pixel.

18. A processor in accordance with claim 16 further configured to:

generate the measured effective atomic number;

determine a pre-stored effective atomic number that is closest to the measured effective atomic number;

determine a pre-stored linear attenuation coefficient corresponding to the pre-stored effective atomic number upon determining the pre-stored effective atomic number closest to the measured effective atomic number;

determine whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient;

change the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel;

determine whether the measured linear attenuation coefficient of the pixel is less than zero upon determining that the pre-stored linear attenuation coefficient is equal to the measured linear attenuation coefficient of the pixel; and

replace the measured linear attenuation coefficient of the pixel with zero upon determining that the measured linear attenuation coefficient of the pixel is less than zero.

19. An imaging system for reducing an artifact within an image of a substance, said imaging system comprising:

an energy source configured to generate energy;

a scatter detector configured to detect a portion of the energy upon passage of the energy through the substance; and

a processor configured to:

generate the image of the substance;

generate at least one of a measured diffraction profile, a measured effective atomic number, and a measured packing fraction of the substance;

determine a pre-stored linear attenuation coefficient corresponding to at least one of a pre-stored diffraction profile, a are-stored effective atomic number, and a pre-stored packing fraction; and

change a measured linear attenuation coefficient of a pixel of the image to match the pre-stored linear attenuation coefficient.

20. An imaging system in accordance with claim 19 , wherein said processor further configured to:

generate the measured packing fraction;

determine a pre-stored packing fraction that is closest to the measured packing fraction;

determine a pre-stored linear attenuation coefficient corresponding to the pre-stored packing fraction upon determining the pre-stored packing fraction closest to the measured packing fraction;

determine whether the measured linear attenuation coefficient of the pixel is equal to the pre-stored linear attenuation coefficient;

change the measured linear attenuation coefficient of the pixel to match the pre-stored linear attenuation coefficient upon determining that the pre-stored linear attenuation coefficient is not equal to the measured linear attenuation coefficient of the pixel;

determine whether the measured linear attenuation coefficient of the pixel is less than zero upon determining that the pre-stored linear attenuation coefficient is equal to the measured linear attenuation coefficient of the pixel; and

replace the measured linear attenuation coefficient of the pixel with zero upon determining that the measured linear attenuation coefficient of the pixel is less than zero.

Assignments (8)