Defective pixel correction method and semiconductor device
A defective pixel correction method selects, in place of a defective pixel within a pixel part of an image pickup device, a pixel which is of the same color as the defective pixel and is adjacent to the defective pixel, and realizes a pseudo redundancy of the pixels.
1 . A defective pixel correction method comprising:
selecting, in place of a defective pixel within a pixel part of an image pickup device, a pixel which is of the same color as the defective pixel and is adjacent to the defective pixel; and
realizing a pseudo redundancy of the pixels.
2 . The defective pixel correction method as claimed in claim 1 , wherein the pixel part includes a plurality of pixels arranged in an X-direction and in a Y-direction which is perpendicular to the X-direction, and the pixel selected in place of the defective pixel is adjacent to the defective pixel along the X-direction.
3 . The defective pixel correction method as claimed in claim 1 , wherein the pixel part includes a plurality of pixels arranged in an X-direction and in a Y-direction which is perpendicular to the X-direction, and the pixel selected in place of the defective pixel is adjacent to the defective pixel along the Y-direction.
4 . The defective pixel correction method as claimed in claim 1 , wherein minimum units of a photodetector element group comprising at least red, green and blue photodetector elements are arranged in an X-direction and in a Y-direction which is perpendicular to the X-direction, and the pixel selected in place of the defective pixel belongs to a minimum unit that is adjacent to a minimum unit to which the defective pixel belongs.
5 . The defective pixel correction method as claimed in claim 1 , wherein the pixel is selected in place of the defective pixel only within a region in a portion of the pixel part.
6 . The defective pixel correction method as claimed in claim 5 , wherein the region in the portion of the pixel part is a region in a central portion of the pixel part.
7 . The defective pixel correction method as claimed in claim 1 , comprising:
carrying out a test to detect the defective pixel within the pixel part; and
generating a selection signal when one of two mutually adjacent pixels of the same color, forming a pair, is detected as the defective pixel,
wherein the selection signal selects the defective pixel in place of the other of the two mutually adjacent pixels.
8 . The defective pixel correction method as claimed in claim 7 , comprising:
supplying the selection signal to the driving part of the image pickup device using a ROM or a fuse.
9 . A semiconductor device comprising:
a pixel part configured to pickup an image, including a plurality of pixels arranged in an X-direction and a Y-direction which is perpendicular to the X-direction; and
a driving part configured to select a pixel within the pixel part,
wherein the driving part drives one of two mutually adjacent pixels of the same color, forming a pair, in place of the other of the two mutually adjacent pixels, in response to a selection signal.
10 . The semiconductor device as claimed in claim 9 , wherein the two mutually adjacent pixels are adjacent to each other along the X-direction.
11 . The semiconductor device as claimed in claim 9 , wherein the two mutually adjacent pixels are adjacent to each other along the Y-direction.
12 . The semiconductor device as claimed in claim 9 , wherein:
the pixel part includes minimum units of a photodetector element group comprising at least red, green and blue photodetector elements, arranged in the X-direction and in the Y-direction; and
the one of the two mutually adjacent pixels driven in place of the other of the two mutually adjacent pixels belongs to a minimum unit that is adjacent to a minimum unit to which the other of the two mutually adjacent pixels belongs.
13 . The semiconductor device as claimed in claim 9 , wherein the driving part drives the one of the two mutually adjacent pixels in response to the selection signal only within a region in a portion of the pixel part.
14 . The semiconductor device as claimed in claim 13 , wherein the region in the portion of the pixel part is a region in a central portion of the pixel part.
15 . The semiconductor device as claimed in claim 9 , wherein the selection signal indicates that the one of the two mutually adjacent pixels that is to be driven is a defective pixel.
16 . The semiconductor device as claimed in claim 9 , further comprising:
a signal source configured to supply the selection signal to the driving part,
wherein the signal source is formed by a ROM or a fuse.