Display substrate for easy detection of pattern misalignment
View Patent ↗A display substrate includes a base substrate, a conductive line on the base substrate, a switching element and a testing member. The switching element includes a first electrode formed on the semiconductor layer pattern and electrically connected to the conductive line, and a second electrode spaced apart from the first electrode and semiconductor layer pattern. The testing member includes a conductive line testing portion that is formed from the same layer as the conductive line and an electrode testing portion that is formed from the same layer as the first electrode. The conductive line testing portion and the electrode testing portion have substantially the same width as the conductive line and the first electrode, respectively. The testing member also includes a semiconductor layer testing portion. The display substrate lends itself to efficient manufacturing with reduced process time and cost.
1. A display substrate comprising:
a base substrate;
a conductive line on the base substrate;
a switching element including:
a gate electrode on the base substrate;
a semiconductor layer pattern on the gate electrode;
a first electrode on the semiconductor layer pattern, the first electrode electrically connected to the conductive line; and
a second electrode spaced apart from the first electrode on the semiconductor layer pattern; and
a testing member for testing a misalignment in the switching element, the testing member including:
a conductive line testing portion formed from the same layer as the conductive line, the conductive line testing portion having substantially the same width as the conductive line;
an electrode testing portion formed from the same layer as the first electrode, the electrode testing portion having substantially the same width as the first electrode; and
a semiconductor layer testing portion between the electrode testing portion and the base substrate.
2. The display substrate of claim 1 , wherein the conductive line comprises a data line.
3. The display substrate of claim 2 , further comprising a gate line formed from the same layer as the gate electrode that is electrically connected to the gate line, the gate line extending substantially perpendicularly to the data line.
4. The display substrate of claim 3 , wherein the testing member further comprises a gate testing portion formed from the same layer as the gate line, and the gate testing portion has substantially the same width as the gate line.
5. The display substrate of claim 4 , wherein the electrode testing portion extends along a center line of the gate testing portion.
6. The display substrate of claim 5 , wherein a difference between a first distance and a second distance indicates an amount of misalignment between a layer for forming the gate line and a layer for forming the data line, wherein the first distance is the distance between a first portion of the gate testing portion and the electrode testing portion and the second distance is the distance between a second portion of the gate testing portion and the electrode testing portion.
7. The display substrate of claim 4 , wherein a difference between a predetermined value and a distance between the gate testing portion and the electrode testing portion indicates an amount of misalignment between a layer for forming the gate line and a layer for forming the data line.
8. The display substrate of claim 1 , wherein the semiconductor layer pattern has substantially the same width as the semiconductor layer testing portion.
9. The display substrate of claim 1 , wherein the testing member is adjacent to a corner of the base substrate.
10. A liquid crystal display device comprising:
a first member including:
a base substrate;
a conductive line on the base substrate;
a switching element including a gate electrode on the base substrate, a semiconductor layer pattern on the gate electrode, a first electrode formed on the semiconductor layer pattern and electrically connected to the conductive line, and a second electrode spaced apart from the first electrode and on the semiconductor layer pattern; and
a testing member for testing a misalignment in the switching element, the testing member including a conductive line testing portion formed from the same layer as the conductive line and having substantially the same width as the conductive line, an electrode testing portion formed from the same layer as the first electrode and having substantially the same width as the first electrode, and a semiconductor layer testing portion between the electrode testing portion and the base substrate;
a second member substantially parallel to the first member; and
a liquid crystal layer interposed between the first member and the second member.