Method for test strip manufacturing and test card analysis
A method of manufacturing a plurality of test strips is described where a web is formed containing conductive and base layers. A plurality of test strips are formed on the web by electrically isolating a first group of conductive components. Subsequently, a second group of conductive components are electrically isolated on the web by a different process. A test card for quality control analysis is also described, where the test card includes a plurality of attached test strip traces.
1 . A method of manufacturing a plurality of test strips, comprising:
forming a web containing a conductive layer and a base layer;
partially forming said plurality of test strips by electrically isolating a first group of conductive components in the conductive layer using a first process; and
subsequently forming said plurality of test strips by electrically isolating a second group of conductive components in the conductive layer using a second process wherein first and second processes are not the same.
2 . The method of claim 1 , wherein the web includes a plurality of registration points.
3 . The method of claim 1 , wherein the first process includes a laser ablation process.
4 . The method of claim 1 , wherein the second process includes a separation process.
5 . The method of claim 4 , wherein the separation process includes stamping.
6 . The method of claim 4 , wherein the separation process includes separating a plurality of test strips from the web.
7 . The method of claim 2 , wherein the plurality of registration points are separated by approximately 9 mm.
8 . The method of claim 2 , wherein the plurality of registration points are separated by less than approximately 9 mm.
9 . The method of claim 1 , wherein the first group of conductive components are separated by less than approximately 9 mm.
10 . The method of claim 4 , wherein a plurality of test strips are separated by a single separation process to form a test card.
11 . The method of claim 10 , wherein the test card includes 6 to 12 test strips.
12 . The method of claim 1 , wherein the method further includes analyzing the formation of the conductive components.
13 . The method of claim 12 , wherein analyzing the formation of the conductive components includes optical analysis.
14 . The method of claim 12 , wherein at least one of the plurality of test strips is analyzed to determine one or more properties of the electrically isolated conductive components.
15 . The method of claim 14 , wherein the working electrode of the at least one of the plurality of test strips is analyzed by chronoamperometry.
16 . A method of analyzing the manufacture of a plurality of test strips, comprising:
forming a web containing a plurality of test strips;
defining an addressable location within the web for at least one of the plurality of test strips; and
analyzing the at least one of the plurality of test strips.
17 . The method of claim 16 , wherein the method further includes encoding the at least one of the plurality of test strips with an identifier.
18 . The method of claim 17 , wherein the method further includes verification of the encoding of the at least one of the plurality of test strips.
19 . A test card for quality control analysis, comprising:
a base layer;
a conductive layer; and
a plurality of test strip traces.
20 . The test card of claim 19 , wherein the test strip traces includes partially formed test strips wherein each test strip contains in the conductive layer, one or more conductive components electrically isolated from one or more of the other conductive components and one or more conductive components not electrically isolated from one or more conductive components.
21 . The test card of claim 19 , wherein the plurality of test strip traces includes one or more test strip traces configured laterally.
22 . The test card of claim 19 , wherein the plurality of test strip traces includes one or more test strip traces configured longitudinally.
23 . The test card of claim 19 , wherein the plurality of test strip traces includes test strip traces configured proximal end to proximal end.
24 . The test card of claim 19 , wherein the plurality of test strip traces includes test strips traces configured distal end to distal end.
25 . The test card of claim 19 , wherein the plurality of test strip traces includes test strips traces configured proximal end to distal end.
26 . A method of analyzing a test card, comprising;
separating a test card comprising a plurality of partially formed test strips from a reel; and
analyzing at least one of the plurality of test strips of the test card.
27 . A method of manufacturing a test card, comprising:
partially forming a plurality of attached test strips; and
separating the plurality of attached test strips card from a web.