Spectral filter system for infrared imaging of substrates through coatings
View Patent ↗An improved system for visual inspection of substrates coated with paints and polymers is disclosed. Painted substrates can be inspected for environmental and physical damage such as corrosion and cracks without removing the paint. The present invention provides the ability to maximize paint thickness penetration. This is accomplished with a spectral bandpass filter that rejects reflected light from the coating opaque bands, while allowing light in the paint window to pass to an IR detector such as an IR camera focal plane. The narrow bandpass range enhances the ability for IR imaging to see through thicker paint layers and improves the contrast over standard commercial IR mid-wave cameras. The bandpass may be adjusted to coincide with the full spectral window of the paint, consistent with the ability of the imaging focal plane to detect light in the spectral region.
1. A system for imaging the surface of a substrate through a coating on the substrate, comprising:
a detector positioned to receive infrared radiation from the substrate surface through the coating on the substrate; and
at least one narrow bandwidth spectral optical filter between the substrate and the detector to pass infrared wavelengths from 3.75 to 5.0 micrometers to the detector, wherein the coating is substantially transparent to the infrared wavelengths passed from the substrate to the detector.
2. The system of claim 1 , wherein the infrared radiation from the substrate comprises blackbody radiation from the substrate.
3. The system of claim 1 , wherein the infrared radiation from the substrate comprises reflected infrared radiation from the substrate.
4. The system of claim 1 , further comprising a source of infrared radiation illuminating the substrate.
5. The system of claim 1 , wherein the detector comprises an infrared camera.
6. The system of claim 5 , wherein the infrared camera detects mid-infrared radiation having wavelengths between about 3 and about 5 microns.
7. The system of claim 1 , wherein the surface of the substrate comprises defects.
8. The system of claim 1 , wherein the substrate comprises an aircraft component.
9. The system of claim 1 , wherein the coating has a thickness of 0.5 to 12 mils.
10. The system of claim 1 , wherein the coating comprises paint, a composite matrix material, primer, top coat and/or intermediate coatings.
11. The system of claim 1 , further comprising means for displaying an image of the object including the detected structural features.
12. The system of claim 1 , further comprising means for comparing an image of the object including the detected structural features with a reference image.
13. The system of claim 12 , wherein the reference image is generated from another object similar to the coated object that is substantially free of defects.
14. The system of claim 1 , further comprising means for comparing an image of the object where the filter may be selected to maximize signal-to-noise ratio and contrast between reflective surfaces through a coating.
15. A method for imaging the surface of a substrate through a coating on the substrate, comprising:
generating infrared light from the substrate through the coating on the substrate;
filtering the infrared light with a narrow bandwidth filter which passes wavelengths within a range of from 3.75 to 5.0 micrometers; and
receiving the filtered infrared light on a detector, wherein the coating is substantially transparent at the wavelengths passed from the substrate to the detector.
16. The method of claim 15 , wherein the infrared radiation from the substrate comprises blackbody radiation from the substrate.
17. The method of claim 15 , wherein the infrared radiation from the substrate comprises reflected infrared radiation from the substrate.
18. The method of claim 15 , further comprising illuminating the substrate with infrared radiation.
19. The method of claim 15 , wherein the coating has a thickness not to exceed 12 mils.
20. The method of claim 15 , further comprising generating at least one image from the detector so as to visually reveal structural features of the substrate.