Test element analysis system with contact surfaces coated with hard material
The invention concerns a test element analytical system for the analytical examination of a sample, especially a body fluid, comprising at least one test element with one or more measuring zones and contact areas located on the test element, in particular electrodes or conductor paths, the sample to be examined being brought into the measuring zone to carry out an analysis in order to determine a characteristic measured quantity for the analysis, and an evaluation instrument with a test element holder for positioning the test element in a measuring position and a measuring device for measuring the characteristic change, the test element holder containing contact elements with contact areas which enable an electrical contact between the contact areas of the test element and the contact areas of the test element holder, characterized in that one of these contact areas is provided with an electrically conductive hard material surface.
1. A test element analytical system for the analytical examination of a sample comprising:
a test element having at least one measuring zone and electrically conductive contact areas, the sample to be examined being brought into the measuring zone for the analytical examination, and
an evaluation instrument having a test element holder for positioning the test element containing the sample and a measuring device for measuring a change in the measuring zone that is characteristic for the analyte, the test element holder containing contact elements with contact areas which enable an electrical contact between the contact areas of the test element and the contact areas of the test element holder, wherein the contact areas of the contact elements of the test element holder comprise an electrically conductive hard material surface, and wherein the contact areas of the test element opposite to the hard material surface comprises a material having a lower hardness than the material of the hard material surface.
2. The test element analytical system of claim 1 , wherein the contact area of the test element opposite to the hard material surface comprises a material comprising a noble metal or an alloy containing a noble metal.
3. The test element analytical system of claim 1 , wherein the contact elements of the test element holder are in the form of plug-in contacts, spring contacts or clip contacts.
4. The test element analytical system of claim 1 , wherein the hard material surface comprises a metallic nitride.
5. The test element analytical system of claim 4 , wherein said metallic nitride is selected from titanium nitride, titanium aluminum nitride, chromium nitride, zirconium nitride, and combinations thereof.
6. The test element analytical system of claim 1 , wherein the hard material surface is produced by coating a base material with an electrically conductive hard material.
7. The test element analytical system of claim 6 , wherein additional intermediate layers are present between the base material and the hard material surface.
8. The test element analytical system of claim 7 , wherein said intermediate layers comprise bonding layers or protecting layers.
9. The test element analytical system of claim 1 , wherein the electrically conductive hard material surface comprises a hard material coating having a layer thickness of less than about 2 μm.
10. The test element analytical system of claim 1 , wherein the electrically conductive hard material surface comprises a hard material coating having a layer thickness of less than about 1 μm.
11. The test element analytical system of claim 1 , wherein the electrically conductive hard material surface comprises a hard material coating having a layer thickness of less than about 500 nm.
12. The test element analytical system of claim 1 , wherein the electrical transition resistance between the contact areas of the test element and the contact areas of the test element holder is less than about 50 Ohm.
13. The test element analytical system of claim 1 , wherein the sample is a body fluid.
14. The test element analytical system of claim 1 , wherein the electrically conductive contact areas comprise electrodes and/or conductor paths.
15. The test element analytical system of claim 14 , wherein the electrodes and/or conductor paths are configured for determining an electrical quantity in an electrochemical test element.
16. An analytical system for analyzing a sample comprising:
a test element comprising a measuring zone and electrically conductive contact areas, and
an evaluation instrument having a test element holder for positioning the test element and providing electrical contact between the instrument and the test element, the test element holder comprising contact areas comprising an electrically conductive hard material surface comprising a metallic nitride having a thickness of less than 2 micrometers that provides electrical contact between the contact areas of the test element and the contact areas of the test element holder with an electrical transition resistance of less than about 50 Ohm, wherein the contact area of the test element opposite to the hard material surface comprises a material having a lower hardness than the material of the hard material surface.
17. A test element analytical system for the analytical examination of a sample comprising:
a disposable test element having at least one measuring zone and electrically conductive contact areas, the sample to be examined being brought into the measuring zone for the analytical examination, and
an evaluation instrument having a test element holder for positioning the test element containing the sample and a measuring device for measuring a change in the measuring zone that is characteristic for the analyte, the test element holder containing contact elements with contact areas which enable an electrical contact between the contact areas of the test element and the contact areas of the test element holder, wherein the contact areas of the contact elements of the test element holder comprise an electrically conductive hard material surface, and wherein the contact area of the test element opposite to the hard material surface comprises a noble metal or an alloy containing a noble metal.
18. The system of claim 17 , wherein the noble metal or an alloy containing a noble metal has a lower hardness than the material of the hard material surface.
19. The system of claim 17 , wherein the hard material surface comprises a metallic nitride.