Methods and apparatus for storing alignment information in a bi-directionally scanning electrophotographic device
View Patent ↗In a bi-directionally scanning electrophotographic (EP) device, methods and apparatus include storing alignment information. In one aspect, pre-characterization parameters of the EP device are stored in memory, such as NVRAM, resistant to the removal of power. In another, actual parameters of the EP device are learned during calibration and stored in the same memory. A controller has local or remote access to the memory and makes comparisons of the pre-characterized and learned parameters to implement corrections. Especially, scan alignment corrections are implemented to alter future scanning of scan lines of latent images on a photoconductor whereby the scan lines are formed in alternating directions. Certain contemplated parameters include, but are not limited to, a scan detect to print distance from a sensor to the start of imaging, temperature, pressure, a scanning mechanism drive signal parameter, such as pulse width, or sensor delay information.
1. A bi-directionally scanning electrophotographic device, comprising;
a photoconductor for being impinged with a plurality of scan lines formed in alternating directions to create a latent image;
a nonvolatile memory, the memory including modeled parameters, the modeled parameters including one of temperature and pressure relative to scan misalignment; and
a controller for producing the latent image on the photoconductor to create a printed image from the latent image, wherein the controller has local or remote access to compare modeled and learned parameters characterizing the scan lines to printed scan lines of the printed image;
wherein the modeled parameters include misalignment profiles, each profile corresponding to a different misalignment value for one of pressure and temperature, one or more of the misalignment profiles are substantially V-shaped having an apex substantially along a centerline of the scan lines, and the one or more of the misalignment profiles provides a misalignment amount y which approximately follows the equation y(x)=[((2 (ax) −1)mx)/(2 (ax) +1))+b], where x is a distance from the centerline, a is a value corresponding to a level of sharpness of a transition on the V-shaped profile that is based upon at least one of pressure and temperature, m is a slope value based upon at least one of pressure and temperature, b is a point intersecting a misalignment y-axis.
2. The device of claim 1 , further including at least one sensor proximate to the photoconductor to reference a start and end of each of the scan lines in alternating directions.
3. The device of claim 2 , wherein the memory stores a scan detect to print distance from the sensor to the start of imaging.
4. The device of claim 1 , wherein the memory stores one of an ambient temperature, an ambient pressure, an expected amount of scan misalignment, and a scanning mechanism drive signal parameter.
5. The device of claim 4 , wherein the scanning mechanism drive signal parameter is a pulse width of a sequence of pulses.
6. The device of claim 1 , wherein the memory stores sensor delay information.
7. The device of claim 1 , wherein the modeled parameters characterizing the scan lines include the other of temperature and pressure relative to scan misalignment.
8. The device of claim 1 , wherein the controller connected to a sensor makes corrections relative to scan misalignment based on inputs received from the sensor.