IP Library Granted Patent US 8,188,519
Granted Patent B2
US 8,188,519 · App. 11/512,006 · Granted May 29, 2012

Solid-state imaging device, drive method of solid-state imaging device, and imaging apparatus

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Quick Facts
Patent No.
US 8,188,519
App. No.
11/512,006
Granted
May 29, 2012
Kind
B2
Abstract

A solid-state imaging device that includes: a pixel array section configured by an array of a unit pixel, including an optoelectronic conversion section that subjects an incoming light to optoelectronic conversion and stores therein a signal charge, a transfer transistor that transfers the signal charge stored in the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, and a reset transistor that resets a potential of the charge-voltage conversion section; and voltage setting means for setting a voltage of a well of the charge-voltage conversion section to be negative.

Claims (34)

1. A solid-state imaging device, comprising:

a pixel array section including an array of a unit pixels, each pixel including an optoelectronic conversion section that performs optoelectronic conversion on incoming light and stores a signal charge, a transfer transistor that transfers the signal charge stored by the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, and a reset transistor that resets a potential of the charge-voltage conversion section; and

a voltage setting unit for setting a voltage of a well of the charge-voltage conversion section to be negative when the reset transistor resets a potential of the charge-voltage conversion section, and wherein the voltage of the well of the charge converting section is set to be greater than a negative voltage after the reset operation and during and after a transfer operation.

2. The solid-state imaging device according to claim 1 , wherein the reset transistor is a depletion transistor.

3. The solid-state imaging device according to claim 1 , wherein

a potential barrier below a gate of the transfer transistor is higher than an overflow path of the optoelectronic conversion section.

4. The solid-state imaging device according to claim 1 , further comprising

means for reducing a voltage to be applied to a gate of the transfer transistor when the voltage setting means sets the voltage of the well to be negative.

5. The solid-state imaging device according to claim 1 , wherein

the unit pixel further includes an amplifier transistor that receives an input of a signal of the charge-voltage conversion section, and

when the amplifier transistor outputs the signal of the charge-voltage conversion section, the voltage setting means sets the voltage of the well to be higher than a reset voltage of the charge-voltage conversion section.

6. A solid-state imaging device, comprising:

a pixel array section including an array of a unit pixels, each pixel including an optoelectronic conversion section that performs optoelectronic conversion on incoming light and stores a signal charge, a transfer transistor that transfers the signal charge stored by the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, a reset transistor that resets a potential of the charge-voltage conversion section, and an amplifier transistor that receives an input of a signal of the charge-voltage conversion section; and

voltage setting unit for setting, when the amplifier transistor outputs the signal of the charge-voltage conversion section, a voltage of a well to be higher than a reset voltage of the charge-voltage conversion section; and wherein the voltage setting unit sets the voltage of the well to be negative when the reset transistor resets the potential of the charge-voltage conversion section, and wherein the voltage of the well of the charge converting section is set to be greater than a negative voltage after the reset operation and during and after a transfer operation.

7. A drive method for driving a solid-state imaging device, the imaging device including: a pixel array section including an array of unit pixels, each unit pixel including an optoelectronic conversion section that performs optoelectronic conversion on incoming light and stores a signal charge, a transfer transistor that transfers the signal charge stored by the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, and a reset transistor that resets a potential of the charge-voltage conversion section, the method comprising:

setting a voltage of a well to be negative when the reset transistor resets a potential of the charge-voltage conversion section, and

transferring the signal charge from the optoelectronic conversion section to the charge-voltage conversion section, wherein the voltage of the well of the charge converting section is set to be greater than a negative voltage after the reset operation and during and after a transfer operation.

8. A drive method for driving a solid-state imaging device, the imaging device including: a pixel array section including an array of a unit pixels, each unit pixel including an optoelectronic conversion section that performs optoelectronic conversion on incoming light and stores a signal charge, a transfer transistor that transfers the signal charge stored by the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, a reset transistor that resets a potential of the charge-voltage conversion section, and an amplifier transistor that receives an input of a signal of the charge-voltage conversion section, the method comprising:

setting a voltage of a well to be higher than a reset voltage of the charge-voltage conversion section when the amplifier transistor outputs the signal of the charge-voltage conversion section; and wherein a voltage setting unit sets the voltage of the well to be negative when the reset transistor resets the potential of the charge-voltage conversion section, and wherein the voltage of the well of the charge converting section is set to be greater than a negative voltage after the reset operation and during and after a transfer operation.

9. An imaging apparatus, comprising:

a solid-state imaging device; and

an optical system that guides a light from an object onto an imaging surface of the solid-state imaging device, wherein

the solid-state imaging device includes:

a pixel array of unit pixels, each unit pixel including an optoelectronic conversion section that performs optoelectronic conversion on incoming light and stores a signal charge, a transfer transistor that transfers the signal charge stored by the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, and a reset transistor that resets a potential of the charge-voltage conversion section; and

voltage setting unit for setting a voltage of a well of the charge-voltage conversion section to be negative when the reset transistor resets a potential of the charge-voltage conversion section, and wherein the voltage of the well of the charge converting section is set to be greater than a negative voltage after the reset operation and during and after a transfer operation.

10. An imaging apparatus, comprising:

a solid-state imaging device; and

an optical system that guides a light from an object onto an imaging surface of the solid-state imaging device, wherein

the solid-state imaging device includes:

a pixel array of unit pixels, each unit pixel including an optoelectronic conversion section that performs optoelectronic conversion on incoming light and stores a signal charge, a transfer transistor that transfers the signal charge stored by the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, a reset transistor that resets a potential of the charge-voltage conversion section, and an amplifier transistor that receives an input of a signal of the charge-voltage conversion section; and

voltage setting unit for setting a voltage of a well to be higher than a reset voltage of the charge-voltage conversion section when the amplifier transistor outputs the signal of the charge-voltage conversion section; and wherein the voltage setting unit sets the voltage of the well to be negative when the reset transistor resets the potential of the charge-voltage conversion section, and the voltage of the well of the charge converting section is set to be greater than a negative voltage after the reset operation and during and after a transfer operation.

11. A solid-state imaging device, comprising:

a pixel array of unit pixels, each unit pixel including an optoelectronic conversion section that performs optoelectronic conversion and stores a signal charge, a transfer transistor that transfers the signal charge stored by the optoelectronic conversion section, a charge-voltage conversion section that converts the signal charge provided by the transfer transistor into a signal voltage, and a reset transistor that resets a potential of the charge-voltage conversion section; and

a voltage setting section configured to set a voltage of a well of the charge-voltage conversion section to be negative when the reset transistor resets a potential of the charge-voltage conversion section, and wherein the voltage of the well of the charge converting section is set to be greater than a negative voltage after the reset operation and during and after a transfer operation.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2016
From: SONY CORPORATION
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 040419/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2009
From: KOGA, FUMIHIKO
To: SONY CORPORATION
Reel/Frame 023545/0913 →