IP Library Granted Patent US 7,890,065
Granted Patent B1
US 7,890,065 · App. 11/515,260 · Granted Feb 15, 2011

Temperature compensated power detector

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,890,065
App. No.
11/515,260
Granted
Feb 15, 2011
Kind
B1
Abstract

A temperature-compensated power detector for detecting variations in the power level of an RF signal. The temperature-compensated power detector includes a detector circuit and a temperature compensating circuit. The detector circuit detects the power level of an RF signal and provides an output voltage that corresponds to the power level of the RF signal. The temperature compensating circuit ensures that the output voltage of the temperature-compensated power detector is independent of changes in the temperature.

Claims (18)

1. A temperature-compensated power detector, the temperature-compensated power detector comprising:

a. a detector circuit, the detector circuit comprising at least one first diode, the at least one first diode detecting a power variation in an input RF signal from an RF signal source, the detector circuit having a first temperature coefficient; and

b. a temperature compensating circuit, the temperature compensating circuit comprising:

i. at least one voltage regulator, the at least one voltage regulator providing a regulated voltage with a second temperature coefficient; and

ii. at least one resistive divider, the at least one resistive divider being coupled to the at least one voltage regulator, the at least one resistive divider dividing each of the regulated voltage and the second temperature coefficient in a pre-defined ratio to provide a biasing voltage with a third temperature coefficient to the at least one first diode, wherein the third temperature coefficient corresponding to the biasing voltage is equal to the first temperature coefficient;

wherein the biasing current passing through the at least one first diode will remain constant.

2. The temperature-compensated power detector of claim 1 , wherein the detector circuit further comprises a first capacitor, the first capacitor isolating the RF signal source from a DC voltage of the at least one first diode, wherein the RF signal source provides the input RF signal to the detector circuit.

3. The temperature-compensated power detector of claim 1 , wherein the detector circuit further comprises one or more capacitors and one or more resistors, the one or more capacitors and the one or more resistors determining the discharging rate of the detector circuit.

4. The detector circuit of claim 1 , wherein the at least one first diode is a diode connected Bipolar Junction Transistor (BJT).

5. The temperature compensating circuit of claim 1 further comprising a capacitor, the capacitor providing a path for AC components of the input RF signal to ground.

6. The temperature-compensated power detector of claim 1 , wherein the at least one voltage regulator comprises at least one diode and at least one transistor, the at least one diode and the at least one transistor determining the second temperature coefficient of the at least one voltage regulator.

7. The at least one voltage regulator of claim 6 , wherein the at least one diode is a diode connected Bipolar Junction Transistor (BJT).

8. The temperature-compensated power detector of claim 1 , wherein the temperature compensating circuit further comprises a switch module, the switch module minimizing leakage current through the detector circuit when the at least one voltage regulator is not enabled.

9. The temperature-compensated power detector of claim 8 , wherein the switch module comprises at least one transistor.

10. The temperature-compensated power detector of claim 9 , wherein the at least one transistor is a Bipolar Junction Transistor (BJT).

11. The temperature-compensated power detector of claim 9 , wherein the at least one transistor is a Field Effect Transistor (FET).

12. The temperature-compensated power detector of claim 9 , wherein the at least one transistor is a pseudomorphic High Electron Mobility Transistor (pHEMT).

13. The temperature-compensated power detector of claim 1 , wherein the at least one voltage regulator is enabled by means of a control voltage.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2017
From: II-VI OPTOELECTRONIC DEVICES, INC.
To: SKYWORKS SOLUTIONS, INC.
Reel/Frame 042551/0708 →
CHANGE OF NAME Recorded May 1, 2017
From: ANADIGICS, INC.
To: II-VI OPTOELECTRONIC DEVICES, INC.
Reel/Frame 042381/0761 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ERRONEOUS NUMBER 6790900 AND REPLACE IT WITH 6760900 PREVIOUSLY RECORDED ON REEL 034056 FRAME 0641. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded Nov 21, 2016
From: ANADIGICS, INC.
To: SILICON VALLEY BANK
Reel/Frame 040660/0967 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 037973 FRAME: 0226. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded May 18, 2016
From: ANADIGICS, INC.
To: II-VI INCORPORATED
Reel/Frame 038744/0835 →
RELEASE OF SECURITY INTEREST Recorded Mar 16, 2016
From: II-VI INCORPORATED
To: ANADIGICS, INC.
Reel/Frame 038119/0312 →
INTELLECTUAL PROPERTY SECURITY AGREEMENT Recorded Mar 1, 2016
From: ANADIGICS, INC.
To: II-IV INCORPORATED
Reel/Frame 037973/0226 →
RELEASE OF SECURITY INTEREST Recorded Mar 1, 2016
From: SILICON VALLEY BANK
To: ANADIGICS, INC.
Reel/Frame 037973/0133 →
SECURITY AGREEMENT Recorded Oct 27, 2014
From: ANADIGICS, INC.
To: SILICON VALLEY BANK
Reel/Frame 034056/0641 →