IP Library Granted Patent US 7,544,307
Granted Patent B2
US 7,544,307 · App. 11/524,914 · Granted Jun 9, 2009

Metal polishing liquid and polishing method using it

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Quick Facts
Patent No.
US 7,544,307
App. No.
11/524,914
Granted
Jun 9, 2009
Kind
B2
Abstract

A metal polishing liquid which contains a compound represented by the following formula (1), an aromatic heterocyclic ring compound, and an oxidizing agent, and a chemical mechanical polishing method using the metal polishing liquid. In the formula (1), R 1 denotes an alkylene group, and R 2 and R 3 each separately denote a hydrogen atom, a halogen atom, an acyl group, an alkyl group, an alkenyl group, an alkynyl group, or an aryl group.

Claims (13)

1. A metal polishing liquid comprising:

a compound represented by the following formula (1), an aromatic heterocyclic ring compound, and an oxidizing agent:

wherein R 1 denotes an alkylene group having 1 to 8 carbon atoms, R 2 and R 3 each separately denote a hydrogen atom, a halogen atom, an acyl group, an alkyl group, an alkenyl group, an alkynyl group, or an aryl group.

2. The metal polishing liquid of claim 1 , wherein the aromatic heterocyclic ring compound is at least one selected from 1,2,3,4-tetrazole, 5-amino-1,2,3,4-tetrazole, 5-methyl-1,2,3,4-tetrazole, 1,2,3-triazole, 4-amino-1,2,3-triazole, 4,5-diamino-1,2,3-triazole, 1,2,4-triazole, 3-amino-1,2,4-triazole, 3,5-diamino-1,2,4-triazole, and benzotriazole.

3. The metal polishing liquid of claim 1 , further comprising abrasive grains.

4. The metal polishing liquid of claim 3 , wherein the abrasive grains are made of colloidal silica.

5. The metal polishing liquid of claim 1 , the liquid is used for polishing a semiconductor integrated circuit.

6. A chemical mechanical polishing method comprising:

contacting a metal polishing liquid that comprises a compound represented by the following formula (1), an aromatic heterocyclic ring compound, and an oxidizing agent with a surface to be polished, and polishing by relatively moving the surface to be polished and a polishing surface:

wherein R 1 denotes an alkylene group having 1 to 8 carbon atoms, R 2 and R 3 each separately denote a hydrogen atom, a halogen atom, an acyl group, an alkyl group, an alkenyl group, an alkynyl group, or an aryl group.

7. The chemical mechanical polishing method of claim 6 , wherein the aromatic heterocyclic ring compound is at least one selected from 1,2,3,4-tetrazole, 5-amino-1,2,3,4-tetrazole, 5-methyl-1,2,3,4-tetrazole, 1,2,3 -triazole, 4-amino-1,2,3-triazole, 4,5-diamino-1,2,3-triazole, 1,2,4-triazole, 3-amino-1,2,4-triazole, 3,5-diamino-1,2,4-triazole, and benzotriazole.

8. The chemical mechanical polishing method of claim 6 , further comprising abrasive grains.

9. The chemical mechanical polishing method of claim 8 , wherein the abrasive grains are made of colloidal silica.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2007
From: FUJIFILM HOLDINGS CORPORATION (FORMERLY FUJI PHOTO FILM CO., LTD.)
To: FUJIFILM CORPORATION
Reel/Frame 018904/0001 →