Method and apparatus for using performance and stress testing on computing devices for device authentication
View Patent ↗A method for authenticating a device including the steps of measuring at least one performance parameter of the device to obtain a measurement; and comparing the measurement of the at least one performance parameter with a previously stored measurement of the at least one performance parameter to determine an identity of the device. An apparatus and an article of manufacture for authenticating a device is also disclosed.
1. A method for determining unique identity for a computing device, comprising steps of:
running, by means of control software, a stress test on the computing device;
obtaining a result from the stress test;
comparing the result of the stress test to results of the stress test previously obtained from other computing devices; and
deriving from the test result an identity token for the computing device if the comparing step determines that the test result is unique to the computing device.
2. The method of claim 1 , further comprising the control software:
selecting the stress test from a plurality of stress tests;
executing the running, obtaining and comparing steps; and
if the comparing step fails to determine that the test result is unique, selecting another stress test from the plurality of stress tests and repeating the method beginning with the running step.
3. The method of claim 1 , further comprising repeating the running, obtaining, and comparing steps a number of times to determine reproducibility of the result.
4. The method of claim 1 , wherein the stress test comprises:
issuing a first instruction to the computing device; and
determining, as the result, an execution time for the first instruction.
5. The method of claim 1 , wherein the stress test comprises:
issuing a plurality of instructions to the computing device; and
determining, as the result, a number of instructions executed by the computing device in a predetermined time period.
6. The method of claim 1 , wherein the stress test comprises:
issuing a plurality of instructions to the device; and
measuring, as the result, time required for the computing device to execute the plurality of instructions.
7. The method of claim 1 , wherein the device is a processor.
8. The method of claim 1 , wherein the device is a digital storage device.
9. The method of claim 1 , wherein the measurement is based on time.
10. The method of claim 1 , wherein the measurement is based on speed of the device.
11. A method for authenticating a computing device, comprising:
running, by means of control software, a stress test on the computing device;
obtaining a result from the stress test;
comparing the result of the stress test to results of the stress test previously obtained from computing devices; and
authenticating the computing device if the test result is equal to at least one of the results obtained from the computing devices.
12. An article of manufacture comprising a non-transitory computer-readable medium having control software stored thereon for causing a processor to perform a method for authenticating a device, the method comprising steps of:
running, by means of control software, a stress test on a target computing device;
obtaining a result from the stress test; comparing the result of the stress test to results of the stress test previously obtained from other computing devices; and
deriving from the test result an identity token for the target computing device if the comparing step determines that the test result is unique to the target computing device.
13. The article of claim 12 , wherein the method further comprises:
selecting the stress test from a plurality of stress tests;
executing the running, obtaining and comparing steps; and
if the comparing step fails to determine that the test result is unique, selecting another stress test from the plurality of stress tests and repeating the method beginning with the running step.
14. The article of claim 12 , wherein the method further comprises repeating the running, obtaining, and comparing steps a number of times to determine reproducibility of the result.
15. The article of claim 12 , wherein the stress test comprises:
issuing a first instruction to the target computing device; and
determining, as the result, an execution time for the first instruction.
16. The article of claim 12 , wherein the stress test comprises:
issuing a plurality of instructions to the target computing device; and
determining, as the result, a number of instructions executed by the target computing device in a predetermined time period.
17. The article of claim 12 , wherein the stress test comprises:
issuing a plurality of instructions to the target computing device; and
measuring, as the result, time required for the target computing device to execute the plurality of instructions.