Method for the adjustment of a light source in a microscope
View Patent ↗A method by which the illumination radiation to be coupled into the illumination beam path of a microscope can be exactly monitored and/or adjusted. In the method for adjusting a light source for a microscope, an imaging optical reflection unit, instead of the objective, is coupled to the microscope in order to image the light of the light source on a detector in such a way that a monitoring of the focus position and/or the position and/or an adjustment of the laser light source with respect to the focus position and/or the position can be carried out. Provided is an approach for monitoring and adjusting a laser beam to be coupled into the illumination beam path of a microscope particularly for using TIRF effects. It can also be used in principle for other solutions in which the parallelism of illumination beams must be monitored and/or adjusted.
1. A method for adjusting a light source for a microscope comprising:
coupling an imaging optical reflection unit, instead of an objective, to the microscope in order to image the light of the light source on a detector in such a way that a monitoring of the focus position and/or the position and/or an adjustment of the light source with respect to the focus position and/or the position can be carried out.
2. The method according to claim 1 , in which the imaging optical reflection unit is so dimensioned that the light of the light source is focused on the detector at the precise moment that the light source is focused on the exit pupil of the objective.
3. The method according to claim 1 , in which a collecting mirror is used as imaging optical reflection unit.
4. The method according to claim 1 , in which a lens or lens arrangement with a reflection element is used as imaging optical reflection unit.
5. The method according to claim 1 , in which the reflection element can have a flat surface or a curved surface.
6. The method according to claim 1 , in which the reflection element can be constructed as a reflecting surface on the lens or lens arrangement.
7. The method according to claim 1 , in which a magnified image of the light source is imaged on the detector by the imaging optical reflection unit.
8. The method according to claim 1 , in which the light of the light source is attenuated by an additional filter provided in the imaging optical reflection unit.
9. The method according to claim 1 , in which the imaging optical reflection unit and the objective are arranged on an objective turret.
10. The method according to claim 1 , in which a plurality of imaging optical reflection units and objectives can be arranged on the objective turret.
11. The method according to claim 1 , in which the light source is a laser light source for TIRF illumination.