IP Library Granted Patent US 7,790,356
Granted Patent B2
US 7,790,356 · App. 11/547,001 · Granted Sep 7, 2010

Condensation type polymer-containing anti-reflective coating for semiconductor

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Quick Facts
Patent No.
US 7,790,356
App. No.
11/547,001
Granted
Sep 7, 2010
Kind
B2
Abstract

There is provided an anti-reflective coating forming composition comprising a polymer having a pyrimidinetrione structure, imidazolidinedione structure, imidazolidinetrione structure or triazinetrione structure and a solvent. The anti-reflective coating obtained from the composition has a high preventive effect for reflected light, causes no intermixing with photoresists, and can use in lithography process by use of a light having a short wavelength such as ArF excimer laser beam (wavelength 193 nm) or F2 excimer laser beam (wavelength 157 nm), etc.

Claims (34)

1. An anti-reflective coating forming composition comprising:

a polymer having a structure of formula (1):

wherein A 1 , A 2 , A 3 , A 4 , A 5 and A 6 independently of one another are hydrogen atom, methyl or ethyl, X 1 is a group of formula (2), (3), (4) or (5):

wherein R 1 and R 2 independently of each other are hydrogen atom, C 1-6 alkyl, C 3-6 alkenyl, benzyl or phenyl, and the phenyl may be substituted by a substituent selected from the group consisting of C 1-6 alkyl, halogen atom, C 1-6 alkoxy, nitro, cyano, hydroxy and C 1-6 alkylthio, or R 1 and R 2 together may form C 3-6 ring, R 3 is C 1-6 alkyl, C 3-6 alkenyl, benzyl or phenyl, and the phenyl may be substituted by a substituent selected from the group consisting of C 1-6 alkyl, halogen atom, C 1-6 alkoxy, nitro, cyano, hydroxy and C 1-6 alkylthio,

Q is a group of formula (6) or (7):

wherein Q 1 is C 1-10 alkylene, phenylene, naphthylene or anthrylene, and the phenylene, naphthylene and anthrylene may be substituted by a substituent selected from the group consisting of C 1-6 alkyl, halogen atom, C 1-6 alkoxy, nitro, cyano, hydroxy and C 1-6 alkylthio, n 1 and n 2 independently of each other are a number of 0 or 1, X 2 is a group of formula (2), (3) or (5),

an acid compound or an acid generator, and

a solvent,

wherein the polymer having the structure of formula (1) is:

a polymer produced by a reaction of a compound of formula (8) with a compound of formula (9)

wherein A 1 , A 2 , A 3 , A 4 , A 5 , A 6 , X 1 and Q are as defined above, or

a polymer produced by a reaction of a compound of formula (10) with a compound of formula (11)

wherein A 1 , A 2 , A 3 , A 4 , A 5 , A 6 , X 1 and Q are as defined above.

2. The anti-reflective coating forming composition according to claim 1 , wherein the structure of formula (1) is a structure of formula (12):

wherein R 1 , R 2 and Q are as defined in claim 1 .

3. The anti-reflective coating forming composition according to claim 1 , wherein the structure of formula (1) is a structure of formula (13):

wherein X 1 is as defined in claim 1 , Y is C 1-6 alkyl, halogen atom, C 1-6 alkoxy, nitro, cyano, hydroxy or C 1-6 alkylthio, m is an integer of 0 to 4, and in case where m is 2 to 4, the Ys may be identical with or different from each other.

4. The anti-reflective coating forming composition according to claim 1 , wherein the polymer having the structure of formula (1) is a polymer produced by a reaction of a compound of formula (8) with a compound of formula (9), and essentially having only the structure of formula (1) as a repeating structural unit.

5. The anti-reflective coating forming composition according to claim 1 , wherein the polymer having the structure of formula (1) is a polymer produced by a reaction of a compound of formula (10) with a compound of formula (11), and essentially having only the structure of formula (1) as a repeating structural unit.

6. The anti-reflective coating forming composition according to claim 1 , wherein the compound of formula (8) is an isocyanuric acid compound or a barbituric acid compound.

7. The anti-reflective coating forming composition according to claim 1 , wherein the compound of formula (9) is a phthalic acid diglycidyl ester compound, a terephthalic acid diglycidyl ester compound or an isophthalic acid diglycidyl ester compound.

8. The anti-reflective coating forming composition according to claim 1 , wherein the compound of formula (10) is a diglycidyl isocyanuric acid compound or a diglycidyl barbituric acid compound.

9. The anti-reflective coating forming composition according to claim 1 , wherein the compound of formula (11) is a barbituric acid compound, a phthalic acid compound, a terephthalic acid compound or an isophthalic acid compound.

10. The anti-reflective coating forming composition according to claim 1 , further comprising a crosslinking compound.

11. The anti-reflective coating forming composition according to claim 10 , wherein the crosslinking compound is a nitrogen-containing compound having two to four nitrogen atoms substituted by methylol or alkoxymethyl.

12. The anti-reflective coating forming composition according to claim 1 , wherein the acid compound is a sulfonic acid compound and the acid generator is an iodonium salt based acid generator or a sulfonium salt based acid generator.

13. The anti-reflective coating forming composition according to claim 1 , further comprising an iodonium salt based acid generator or a sulfonium salt based acid generator and a sulfonic acid compound.

14. An anti-reflective coating obtained by coating the anti-reflective coating forming composition according to claim 1 on a semiconductor substrate, and baking it.

15. A method for forming photoresist pattern for use in manufacture of a semiconductor device, comprising:

coating the anti-reflective coating forming composition as described in claim 1 on a semiconductor substrate, and baking it to form an anti-reflective coating,

forming a photoresist layer on the anti-reflective coating,

exposing the semiconductor substrate covered with the anti-reflective coating and the photoresist layer to light, and

developing the photoresist layer after the exposure to light.

16. The method for forming photoresist pattern according to claim 15 , wherein the exposure to light is carried out with ArF excimer laser beam (wavelength 193 nm).

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Feb 23, 2010
From: CHARTIS SPECIALTY INSURANCE COMPANY (F/K/A/AMERICAN INTERNATIONAL SPECIALTY LINES INSURANCE COMPANY; CHARTIS PROPERTY CASUALTY COMPANY (F/K/A/ BIRMINGHAM FIRE INSURANCE COMPANY OF PENNSYLVANIA; NEW HAMPSHIRE INSURANCE COMPANY
To: PRETIUM PACKAGING, L.L.C.
Reel/Frame 023973/0116 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 5, 2007
From: PRETIUM PACKAGING, L.L.C.
To: DYMAS FUNDING COMPANY, LLC, AS AGENT
Reel/Frame 018711/0218 →
SECURITY AGREEMENT Recorded Jan 5, 2007
From: PRETIUM PACKAGING, L.L.C.
To: AMERICAN INTERNATIONAL SPECIALTY LINES INSURANCE COMPANY; BIRMINGHAM FIRE INSURANCE COMPANY OF PENNSYLVANIA; NEW HAMPSHIRE INSURANCE COMPANY
Reel/Frame 018711/0638 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 2, 2006
From: KISHIOKA, TAKAHIRO; SAKAMOTO, RIKIMARU; HIROI, YOSHIOMI; MARUYAMA, DAISUKE
To: NISSAN CHEMICAL INDUSTRIES, LTD.
Reel/Frame 018397/0642 →