Methods and apparatus for time-of-flight mass spectrometer
View Patent ↗Disclosed is a method of determining when to calibrate a time-of-flight mass spectrometer. In various embodiments, the method comprises storing within a controller a set of parameters for the mass spectrometer; providing an updated set of parameters while retaining at least one set of previously stored parameters; computing at least one rate of change of the updated set of parameters with respect to the at least one set of previously stored parameters; and determining when to calibrate the mass spectrometer from the results of computing the rate of change of at least one of the parameters. In various embodiments, a parameter stored can be a set of temperatures derived from obtaining system temperature measurements of those components whose changing temperature is an indication of mass drift. In various embodiments, the controller can store a history of calibration factors and temperatures over time, can calculate the time rate of change of the calibration factors and the temperature to estimate the mass drift rate of the instrument and compare the drift rate to a predetermined mass error limit for determining when re-calibration can be scheduled.
1. A method of determining when to calibrate a time-of-flight mass spectrometer comprising:
(a) storing within a controller a set of parameters for the mass spectrometer;
(b) providing an updated set of parameters while retaining at least one set of previously stored parameters;
(c) computing at least one rate of change of the updated set of parameters with respect to the at least one set of previously stored parameters; and
(d) determining when to calibrate the mass spectrometer from the results derived from step (c).
2. The method of claim 1 wherein the parameters are selected from one of calibration factors, temperature and voltage or a combination thereof.
3. The method of claim 1 wherein step (d) comprises estimating a mass drift rate computed from the rate of change of the updated parameters.
4. The method of claim 2 comprising scheduling the time of the next calibration of the mass spectrometer to maintain a predetermined mass error limit.
5. The method of claim 2 comprising storing calibration factors and at least one temperature measurement that affects mass accuracy.
6. The method of claim 5 wherein the interval of providing updated temperature measurement is more frequent than the interval of providing updated calibration factors.
7. The method of claim 6 wherein the updated temperature measurement initiates computing the rate of change of the temperature and step (d).
8. The method of claim 1 wherein the updated parameters are provided by recalibrating the mass spectrometer using mass standards.
9. The method of claim 1 wherein the updated parameters are computed from intentional adjustments in operating parameters of the mass spectrometer.
10. The method of claim 9 wherein the adjustments are changes to the voltage applied to an ion optic element of the mass spectrometer.