Discretely controlled micromirror with multi-level positions
View Patent ↗This invention provides the two types of Discretely Controlled Micromirror (DCM), which can overcome disadvantages of the conventional electrostatic micromirrors. The first type micromirror is a Variable Supporter Discretely Controlled Micromirror (VSDCM), which has a larger displacement range than the conventional electrostatic micromirror. The displacement accuracy of the VSDCM is better than that of the conventional electrostatic micromirror and the low driving voltage is compatible with IC components. The second type of DCM, the Segmented Electrode Discretely Controlled Micromirror (SEDCM) has same disadvantages with the conventional electrostatic micromirror. But the SEDCM is compatible with known microelectronics technologies.
1. A Discretely Controlled Micromirror (DCM) array comprising:
a) a plurality of micromirrors are mounted in side-by-side array to define a spatial light modulator; and
b) a plurality of segmented electrodes;
wherein each of the micromirror has three degrees of freedom motion by combinations of segmented electrodes with different areas, positions, and discrete voltages, and
wherein the applied voltage to the segmented electrodes is digital and/or discrete and
wherein the one degree of freedom tranlslation of the DCM is controlled to retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
2. The DCM array of claim 1 , wherein the DCM is controlled by electrostatic force.
3. The DCM array of claim 2 , wherein the electrostatic force is controlled by digital and/or discrete voltage operation.
4. The DCM array of claim 1 , wherein the segmented electrodes are located under the micromirror.
5. The DCM array of claim 1 , wherein in-plane positions of the segmented electrodes are changed.
6. The DCM array of claim 1 , wherein the areas of the segmented electrodes are changed.
7. The DCM array of claim 1 , wherein the surface material of the micromirror is the one with high reflectivity.
8. The DCM array of claim 1 , wherein the surface material of the micromirror is metal.
9. The DCM array of claim 1 , wherein the surface material of the micromirror is metal compound.
10. The DCM array of claim 1 , wherein the surface of the micromirror is made with multi-layered dielectric coating.
11. The DCM array of claim 1 , wherein the DCM is made by a method in which the material of structural layer is metal.
12. The DCM array of claim 11 , wherein an aluminum layer is sputter-deposited and plasma-etched using plasma-deposited SiO 2 as an etch mask.
13. The DCM array of claim 11 , wherein the material of a sacrificial layer that forms air gaps is a photoresist.
14. The DCM array of claim 11 , wherein the DCM is made by a method in which layers deposited by microfabrication proton are planarized using a chemical mechanical polishing (CMP) technique.
15. The DCM array of claim 11 , wherein the micromirror is fabricated using electroplating techniques.
16. The DCM array of claim 15 , wherein the electroplating technique uses the unique sacrificial metallic mold, which plays multiple roles of an electroplating mold for posts and seed layers.
17. The DCM array of claim 15 , wherein electroplated nickel is used for structural layers.
18. The DCM array of claim 15 , wherein electroplated copper is used for sacrificial layers.
19. The DCM array of claim 1 , wherein the micromirrors are controlled independently.
20. The DCM array of claim 1 , wherein the micromirrors are mounted in side-by-side array.
21. The DCM array of claim 1 , wherein the one degree of freedom rotation of the DCM is controlled to scan a field of regard.
22. The DCM array of claim 1 , wherein the two degrees of freedom rotation of the DCM is controlled to scan a field of regard.
23. The DCM array of claim 1 , wherein the one degree of freedom rotation of the DCM is controlled to scan a field of regard, which the DCM can also retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
24. The DCM array of claim 1 , wherein the two degrees of freedom rotation of the DCM is controlled to scan a field of regard, which the DCM can also retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
25. The DCM array of claim 19 , wherein a control circuitry is constructed under the micromirror using microelectronics technologies.
26. The DCM array of claim 25 , wherein a thick oxide is deposited over metal of the microelectronics circuits.