Method and system for noise control in semiconductor spectroscopy system
View Patent ↗An optical power control system for a semiconductor source spectroscopy system controls power fluctuations in the tunable signal from the spectroscopy system and thus improves the noise performance of the system. This general solution has advantages relative to other systems that simply detect reference power levels during the scan and then correct the detected signal after interaction with the sample by reducing the requirements for coordinating the operation of the sample detectors and power or reference detectors. The spectroscopy system comprises a semiconductor source and a tunable filter. The combination of the semiconductor source and tunable signal illuminate a sample with a tunable signal, being tunable over a scan band. The power control system comprises an amplitude detector system for detecting the power of the tunable optical signal and power control system for regulating the amplitude of the tunable optical signal in response to its detected power.
1. A spectroscopy system, comprising
a tunable laser with a semiconductor source illuminating a sample with a tunable optical signal, which is tunable over a scan band;
a detector for detecting a sample signal generated by interaction of the tunable optical signal with the sample;
an optical power control system including:
an amplitude detector system for detecting an amplitude of the tunable optical signal, located optically between the tunable laser and the sample to detect the tunable signal after generation by the tunable laser and before interaction with the sample, and
a power control system for regulating the amplitude of the tunable optical signal in response to the detected amplitude by controlling power to the semiconductor source.
2. An optical power control system as claimed in claim 1 , wherein the semiconductor source comprises a semiconductor optical amplifier and the laser further comprises a tunable filter that controls the wavelength of the tunable signal.
3. An optical power control system as claimed in claim 2 , wherein a laser cavity is a linear cavity.
4. An optical power control system as claimed in claim 2 , wherein a laser cavity is a ring cavity.
5. An optical power control system as claimed in claim 2 , wherein the tunable filter is a microelectromechanical system filter.
6. An optical power control system as claimed in claim 2 , wherein the tunable filter is a microelectromechanical filter comprising thin film coating mirror structures.
7. An optical power control system as claimed in claim 1 , wherein the amplitude detector system comprises a detector; and a tap providing a portion of the tunable optical signal to the detector.
8. An optical power control system as claimed in claim 1 , wherein semiconductor source spectroscopy system comprises an optical bench, to which the semiconductor source and a tunable filter, controlling the wavelength of the tunable signal, are attached.
9. An optical power control system as claimed in claim 8 , wherein the amplitude detector system comprises:
a detector, which is attached to the bench; and
a tap, which is attached to the bench, providing a portion of the tunable optical signal to the detector.
10. An optical power control system as claimed in claim 1 , wherein the power control system stabilizes the amplitude of the tunable optical signal by controlling power to the semiconductor source.
11. An optical power control system as claimed in claim 1 , wherein the power control system comprises an optical signal power regulator for regulating the amplitude of the tunable optical signal.
12. An optical power control system as claimed in claim 1 , wherein the power control system comprises an optical signal attenuator for regulating the amplitude of the tunable optical signal by attenuating the tunable optical signal in response to the amplitude detector system.
13. An optical power control method for a spectroscopy system, comprising a laser with a semiconductor source illuminating a sample with a tunable optical signal generated by the laser, which is tunable over a scan band, and a detector for detecting a sample signal generated by interaction of the tunable optical signal with the sample, the optical power control comprising:
detecting an amplitude of the tunable optical signal after generation by the tunable laser and before interaction with the sample; and
regulating the amplitude of the tunable optical signal in response to the detected amplitude by controlling power to the semiconductor source.
14. An optical power control method as claimed in claim 13 , further comprising a step of generating the tunable optical signal by powering a semiconductor optical amplifier and controlling a wavelength of the tunable optical signal with a tunable filter.
15. An optical power control system as claimed in claim 13 , wherein the step of regulating the amplitude comprises regulating the amplitude of the tunable optical signal by attenuating the tunable optical signal in response to the amplitude.
16. A laser system, comprising
a tunable laser with a semiconductor source illuminating a sample with a tunable optical signal, which is tunable over a scan band;
a detector for detecting a sample signal generated by interaction of the tunable optical signal with the sample;
an optical power control system including:
an amplitude detector system for detecting an amplitude of the tunable optical signal, located optically between the tunable laser and the sample to detect the tunable signal after generation by the tunable laser and before interaction with the sample, and
a power control system for regulating the amplitude of the tunable optical signal in response to the detected amplitude by controlling power to the semiconductor source.
17. An optical power control system as claimed in claim 16 , wherein the semiconductor source comprises a semiconductor optical amplifier and the laser further comprises a tunable filter that controls the wavelength of the tunable signal.
18. An optical power control system as claimed in claim 16 , wherein semiconductor source spectroscopy system comprises an optical bench, to which the semiconductor source and a microelectromechanical tunable filter, controlling the wavelength of the tunable signal, are attached.
19. An optical power control system as claimed in claim 18 , wherein the amplitude detector system comprises:
a detector, which is attached to the bench; and
a tap, which is attached to the bench, providing a portion of the tunable optical signal to the detector.