IP Library Granted Patent US 7,615,398
Granted Patent B2
US 7,615,398 · App. 11/564,207 · Granted Nov 10, 2009

Pyramidal photonic crystal light emitting device

Assignee: Luxtaltek Corporation
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Quick Facts
Patent No.
US 7,615,398
App. No.
11/564,207
Granted
Nov 10, 2009
Kind
B2
Abstract

A light-emitting device (LED) is described which exhibits high extraction efficiency and an emission profile which is substantially more directional than from a Lambertian source. The device comprises a light generating layer disposed between first and second layers of semiconductor material, each having a different type of doping. An upper surface of the first layer has a tiling arrangement of pyramidal or frustro-pyramidal protrusions of semiconductor material surrounded by a material of different refractive index which together comprise a photonic band structure. The protrusions and their tiling arrangement are configured for efficient extraction of light from the device via the upper surface of the first layer and in a beam that is substantially more directional than from a Lambertian source An enhanced device employs a reflector beneath the second layer to utilize the microcavity effect. A method for fabricating the device is also described which employs anisotropic wet etching to produce the pyramidal or frustro-pyramidal protrusions

Claims (20)

1. A method for fabricating a light-emitting device (LED) comprising the steps of:

fabricating a light-emitting device heterostructure, the device heterostructure comprising a first layer comprising a first semiconductor material having a first type of doping, a second layer comprising a second semiconductor material having a second type of doping, and a light-generating layer disposed between the first and second layers, wherein the first layer has an upper surface distal the light-generating layer and a lower surface proximate the light-generating layer and wherein light generated in the light-generating layer emerges from the LED structure through the upper surface of the first layer,

wherein the light-emitting device heterostructure is fabricated using a flip-chip process, the flip-chip process including:

forming the first layer on a substrate;

forming the subsequent layers upon the first layer; and,

removing the substrate to expose the first layer,

forming an etch mask on the exposed first layer, the mask comprising islands of mask material at locations corresponding to a predetermined tiling arrangement, wherein the step of forming the mask comprises the steps of:

depositing a layer of photoresist over the first layer;

patterning the photoresist by exposure according to the predetermined tiling arrangement; and,

removing unexposed photoresist to leave islands of photoresist at locations corresponding to the predetermined tiling arrangement;

forming pyramidal or frustro-pyramidal projections of the first semiconductor material in the first layer at locations beneath the islands of mask material by anisotropically wet etching the first semiconductor material to a predetermined depth along predetermined crystal planes; and,

removing the islands of mask material to leave behind the predetermined tiling arrangement of pyramidal or frustro-pyramidal projections, which in combination with a surrounding material of different refractive index comprise a photonic band structure.

2. A method according to claim 1 , wherein the step of forming an etch mask further comprises the steps of:

depositing a layer of hard mask material over the first layer before the step of depositing the layer of photoresist;

removing hard mask material after the step of removing photoresist to leave islands of hard mask material beneath the islands of photoresist; and,

removing the remaining islands of photoresist to leave behind the etch mask comprising the islands of hard mask material at locations corresponding to the predetermined tiling arrangement.

3. A method according to claim 1 , wherein the first layer of the light-emitting device heterostructure comprises a layer of etch stop material embedded at the predetermined depth in the first semiconductor material.

4. A method according to claim 3 , wherein the predetermined depth corresponds to a desired thickness for the light-emitting device.

5. A method according to claim 3 , wherein the predetermined depth corresponds to a desired shape of inverted frustro-pyramidal indentation.

6. A method according to claim 1 , wherein the predetermined tiling arrangement comprises a quasicrystal tiling pattern and wherein the pitch of the tiling arrangement is greater than or equal to 1.5 μm.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2024
From: QUANTUM NIL LIMITED; QUANTUM NIL LIMITED TAIWAN BRANCH
To: QUANTUM NIL CORPORATION; QUANTUM NIL TECHNOLOGY PTE. LTD.
Reel/Frame 068763/0564 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2022
From: NANOGAN LTD.
To: QUANTUM NIL LIMITED; QUANTUM NIL LIMITED TAIWAN BRANCH
Reel/Frame 060944/0958 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2018
From: LUXTALTEK CORPORATION
To: NANOGAN LTD.
Reel/Frame 044645/0673 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 6, 2008
From: MESOPHOTONICS LIMITED
To: LUXTALTEK CORPORATION
Reel/Frame 021351/0243 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2007
From: MCKENZIE, JAMES; LEE, TOM; ZOOROB, MAJD
To: MESOPHOTONICS LIMITED
Reel/Frame 018976/0598 →
Continuity (1)
Related Publication 20080121912A1 · May 29, 2008