Optical reflectometry using integrated VCSEL photodiode chip

1. A method of testing an optical waveguide to determine a distance in the optical waveguide to an occurrence of interest, the method comprising:

at a VCSEL, emitting a wavelength modulated optical signal into a waveguide;

receiving at the VCSEL a reflection of the wavelength modulated optical signal, wherein the reflection is caused by an occurrence of interest affecting the waveguide at a particular wavelength and wherein the reflection being received at the VCSEL causes a change in the VCSEL output;

detecting the change in the VCSEL output;

correlating the change in VCSEL output to a distance in the waveguide, wherein the distance is, at least approximately, a distance to the occurrence of interest; and

determining the distance in the optical waveguide to the occurrence of interest based on the correlation of the change in VCSEL output to the distance in the waveguide.

2. The method of claim 1 , wherein detecting the change in the VCSEL output comprises measuring a number of wavelengths or partial wavelengths within the waveguide.

3. The method of claim 2 , wherein measuring a number of wavelengths comprises using counter circuitry to measure peaks of the changed VCSEL output.

4. The method of claim 3 , wherein correlating the change in VCSEL output to a distance in the waveguide comprises calculating a distance based on a factor of the number of peaks and the wavelength of the changed VCSEL output.

5. The method of claim 2 , wherein measuring a number of wavelengths comprises calculating a distance based on a dominant frequency in the spectrum and the wavelength of the changed VCSEL output.

6. The method of claim 5 , wherein calculating a distance based on a dominant frequency in the spectrum and the wavelength of the changed VCSEL output comprises using fast Fourier transform (FFT) circuitry to measure the spectrum.

7. The method of claim 1 , wherein detecting the change in the VCSEL output comprises detecting optical signals at a photodiode fabricated in the same epitaxial structure as the VCSEL.

8. The method of claim 1 , further comprising modulating the VCSEL with a current that is modulated in a milliamp range to accomplish emitting a wavelength modulated optical signal.

9. The method of claim 1 , further comprising modulating the VCSEL with a current that is modulated in a microamp range to accomplish emitting a wavelength modulated optical signal.

10. The method of claim 1 , wherein the modulated optical signal is modulated using a ramped current.

11. A method of testing an optical waveguide to determine a distance in the optical waveguide of an occurrence of interest, the method comprising:

at a VCSEL, emitting an optical pulse into a waveguide;

receiving at a photodiode disposed in the same epitaxial structure as the VCSEL a reflection of the pulse such that the reflection of the pulse passes through the VCSEL and onto the photodiode, wherein the reflection is caused by an occurrence of interest affecting the waveguide;

measuring an amount of time between when the pulse was emitted and when the reflection was received;

correlating the amount of time to a distance in the waveguide, wherein the distance is, at least approximately, a distance to the occurrence of interest;

at the VCSEL, emitting a wavelength modulated optical signal into the waveguide;

receiving at the VCSEL a reflection of the wavelength modulated optical signal, wherein the reflection is caused by the occurrence of interest affecting the waveguide at a particular wavelength and wherein the reflection being received at the VCSEL causes a change in the VCSEL output;

detecting the change in the VCSEL output;

correlating the change in VCSEL output to a distance in the waveguide, wherein the distance is, at least approximately, a distance to the occurrence of interest; and

determining the distance in the optical waveguide to the occurrence of interest based on the correlation of the change in VCSEL output to the distance in the waveguide or based on the correlation of the amount of time to the distance in the waveguide.

12. The method of claim 11 , wherein correlating the amount of time to a distance in the waveguide comprises using characteristics of the waveguide and the wavelength of the pulse to calculate a distance.

13. The method of claim 11 , wherein emitting an optical pulse comprises emitting a pulse with a width and a duty cycle which allows ringing in the photodiode to decay to an acceptable level.

14. The method of claim 11 , further comprising biasing the VCSEL with a DC signal to decrease the response time of the VCSEL.

15. The method of claim 11 , wherein the optical pulse does not include a DC component to decrease energy consumption of a test device implementing the method.

16. A test apparatus configured to test for occurrences of interest along an optical waveguide, the test apparatus comprising:

a VCSEL;

a pulse generator coupled to the VCSEL configured to cause the VCSEL to emit an optical pulse into a waveguide;

a photodiode disposed in the same epitaxial structure as the VCSEL;

a timer communicatively coupled to the VCSEL and the photodiode, wherein the timer is configured to measure an amount of time between when a pulse is emitted by the VCSEL and when a reflection of the pulse passes through the VCSEL and onto the photodiode, wherein the reflection is caused by an occurrence of interest affecting the waveguide;

a modulating generator selectively coupled to the VCSEL, the modulating generator configured to modulate the wavelength of the VCSEL, and wherein the pulse generator is selectively coupled to the VCSEL such that a generator is selectively coupled to the VCSEL; and

analyzing circuitry selectively coupled to the photodiode, the analyzing circuitry configured to detect changes in the VCSEL output and wherein the timer is selectively coupled to the photodiode such that either the analyzing circuitry or the timer circuitry can be operatively coupled to the photodiode.