IP Library Granted Patent US 7,955,581
Granted Patent B2
US 7,955,581 · App. 11/580,117 · Granted Jun 7, 2011

Method of producing silicon oxide, negative electrode active material for lithium ion secondary battery and lithium ion secondary battery using the same

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Quick Facts
Patent No.
US 7,955,581
App. No.
11/580,117
Granted
Jun 7, 2011
Kind
B2
Abstract

A method for producing a silicon oxide including the steps of supplying silicon atoms onto a substrate through an oxygen atmosphere to form a silicon oxide layer on the substrate, and separating the silicon oxide layer from the substrate and pulverizing the separated silicon oxide layer to obtain silicon oxide containing silicon and oxygen in predetermined proportions, and a negative electrode active material obtained by the production method.

Claims (16)

1. A method for producing a silicon oxide, wherein:

a vapor deposition apparatus is utilized, the vapor deposition apparatus comprising a vacuum chamber, a gas supply inlet for supplying an oxygen-containing gas into the vacuum chamber, a pressure reduction outlet for reducing pressure inside the vacuum chamber and an electron beam heater, and

the method comprises steps of:

(a1) disposing a metal substrate and a target essentially consisting of silicon inside the vacuum chamber;

(a2) creating an oxygen atmosphere by supplying the oxygen-containing gas from the gas supply inlet, while reducing pressure inside the vacuum chamber;

(a3) heating the target with the electron beam heater for evaporating silicon atoms from the target;

(a4) forming a silicon oxide layer on the substrate by reaction between the evaporated silicon atoms and oxygen in the oxygen atmosphere; and

(b) obtaining silicon oxide particles by separating the silicon oxide layer from the substrate and then pulverizing the separated silicon oxide layer,

wherein a molar ratio of oxygen atoms to silicon atoms in the silicon oxide particles is 0.2 to 0.9.

2. The method of claim 1 , wherein:

the vapor deposition apparatus further comprises, inside the vacuum chamber a unit for converting the oxygen-containing gas into plasma, and

the method further includes, before the step (b), a step (c) of converting the oxygen-containing gas into plasma.

3. The method of claim 1 , wherein an average particle size of the silicon oxide particles is 0.5 to 20 μm.

4. The method of claim 1 , wherein said target consisting of silicon has a purity of 99.9999%.

5. The method of claim 1 , wherein the metal substrate has a high melting point.

6. The method of claim 1 , wherein the metal substrate includes iron or steel.

Assignments (2)
CHANGE OF NAME Recorded Nov 24, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021897/0689 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 5, 2007
From: KOGETSU, YASUTAKA; ISHIDA, SUMIHITO
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 018959/0847 →