Method for reducing sensitivity modulation and lag in electronic imagers
View Patent ↗A method for reducing gain and lag signals associated with trapped charges is described. Data is collected from a detector. A forward bias voltage is temporarily applied to the detector between collecting the data.
1. A method, comprising:
collecting data from a detector, the detector connected to a pixel Thin Film Transistor (TFT) and a reset TFT in series;
applying a forward bias voltage to the detector between collecting data while closing the pixel TFT and the reset TFT;
opening the pixel TFT and the reset TFT and applying a reverse bias voltage to the detector; and
resetting the detector by closing the pixel TFT and the reset TFT for a predetermined amount of time for one or more cycle while applying the reverse bias voltage to the detector.
2. The method of claim 1 , wherein the detector further comprises a photosensor.
3. The method of claim 2 , wherein the photosensor includes an amorphous silicon photodiode.
4. The method of claim 1 , wherein the detector is to receive an x-ray beam from an x-ray source.
5. The method of claim 4 , further comprising:
disabling the x-ray source between collecting data.
6. The method of claim 1 , wherein applying the forward bias voltage further comprises:
switching to the forward bias voltage between collecting data; and
switching to the reverse bias voltage while collecting data.
7. The method of claim 1 , further comprising:
applying a forward bias voltage to the detector in a cyclical period.
8. The method of claim 1 , wherein applying the forward bias voltage further comprises:
connecting a cathode end of the detector with a potential lower than that of an anode end of the detector.
9. A detector comprising:
a photosensor circuit having a photodiode connected to a pixel TFT and a reset TFT in series; and
a switch coupled to the photosensor circuit,
wherein the switch is coupled to a first voltage source to forward bias the photodiode, and is coupled to a second voltage source to reverse bias the photodiode.
10. The detector of claim 9 , wherein a potential of the first voltage source is higher than the potential of the second voltage source.
11. The detector of claim 10 , wherein the first voltage source includes a positive voltage, and the second voltage source includes a negative voltage.
12. The detector of claim 9 , wherein the switch couples the photosensor circuit to the first voltage source between collections of data from the detector.
13. The detector of claim 9 , wherein the switch couples the photosensor circuit to the first voltage source after each frame detected by the detector.
14. The detector of claim 9 , wherein the photosensor circuit further comprises:
a photodiode coupled to a capacitor;
the pixel TFT coupled to the photodiode and the capacitor; and
an amplifier coupled to the pixel TFT.
15. The detector of claim 14 , further comprising:
the reset TFT coupled to the amplifier in parallel to reset a readout cycle of the detector.
16. The detector of claim 15 , wherein the pixel TFT is coupled to a cathode end of the photodiode.
17. The detector of claim 16 , wherein the switch is coupled to an anode end of the photodiode.
18. The detector of claim 9 , wherein the photosensor is to detect an x-ray beam from an x-ray source.
19. An imaging system comprising:
a source of radiation;
a detector for sensing radiation from the source and generating data representative of the radiation, the detector comprising a photodiode coupled to a pixel TFT and a reset TFT in parallel; and
a processor coupled to the detector and configured to switch a voltage applied to the detector between a first voltage source to forward bias the photodiode, and coupled to a second voltage source to reverse bias the photodiode, and to reset the detector by closing the pixel TFT and the reset TFT for a predetermined amount of time for one or more cycle while applying the second voltage source to the detector.
20. The imaging system of claim 19 , wherein the source of radiation includes an x-ray source emitting an x-ray beam.
21. The imaging system of claim 19 , wherein the detector further comprises at least one solid state x-ray detector.
22. The imaging system of claim 19 , wherein the detector further comprises:
a photosensor circuit; and
a switch coupled to the photosensor circuit,
wherein the switch is coupled to the first voltage source and the second voltage source.
23. The imaging system of claim 19 , wherein a potential of the first voltage source is higher than the potential of the second voltage source.
24. The imaging system of claim 23 , wherein the first voltage source includes a positive voltage, and the second voltage source includes a negative voltage.
25. The imaging system of claim 22 , wherein the switch couples the photosensor circuit to the first voltage source between collections of data from the detector.
26. The imaging system of claim 25 , wherein the switch couples the photosensor circuit to the first voltage source after each frame detected by the detector.
27. The imaging system of claim 22 , wherein the photosensor circuit further comprises:
a photodiode coupled to a capacitor;
the pixel TFT coupled to the photodiode and the capacitor; and
an amplifier coupled to the pixel TFT.
28. The imaging system of claim 27 , further comprising:
the reset TFT coupled to the amplifier to reset a readout cycle of the detector.
29. The imaging system of claim 28 , wherein the first switch is coupled to a cathode end of the photodiode.
30. The imaging system of claim 29 , wherein the switch is coupled to an anode end of the photodiode.
31. The imaging system of claim 19 , wherein traps in the detector are substantially filled when the voltage is switched from the second voltage source to the first voltage source.
32. The method of claim 1 , wherein collecting further comprises collecting data from a plurality of photodiodes of the detector, the detector including a plurality of pixel TFTs, and a plurality of reset TFTs, the photodiodes each connected to a pixel TFT and a reset TFT in series;
wherein applying further comprises applying a forward bias voltage to the plurality of photodiodes between collecting data while closing the pixel TFTs and the reset TFTs;
wherein opening further comprises opening the pixel TFTs and the reset TFTs and applying a reverse bias voltage to the plurality of photodiodes; and
wherein resetting further comprises resetting the plurality of photodiodes by closing the pixel TFTs and the reset TFTs for a predetermined amount of time for one or more cycles while applying the reverse bias voltage to the plurality of photodiodes.
33. The method of claim 1 , wherein applying further comprises switching a switch in series with an anode of a photodiode to a positive bias voltage to apply the forward bias voltage to the photodiode between collecting data while closing the pixel TFT and the reset TFT;
wherein opening further comprises opening the pixel TFT and the reset TFT and switching the switch to a negative bias voltage to apply a reverse bias voltage to the photodiode.
34. The detector of claim 9 , wherein the detector further comprises:
a plurality of photosensor circuits having photodiodes each connected to a pixel TFT and a reset TFT in series to reset each photodiode by closing the pixel TFT and the reset TFT for a predetermined amount of time for one or more cycles while applying the reverse bias voltage to the photodiode.
35. The imaging system of claim 19 , wherein the system further comprises at least one switch coupled in series with an anode of the photodiode to switch the voltage applied to the detector from the first voltage source to forward bias the photodiode.